Kazumi Matsushige

Person

Uji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scan device for microscope measurement instrument
- Patent number 8,796,654
- Issue date Aug 5, 2014
- Shimadzu Coporation
- Masahiro Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus and method of obtaining field by measurement
- Patent number 8,536,862
- Issue date Sep 17, 2013
- Kyoto University
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for processing output of scanning type probe microscope, and...
- Patent number 8,225,418
- Issue date Jul 17, 2012
- Kyoto University
- Eika Tsunemi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron beam irradiation device
- Patent number 7,829,863
- Issue date Nov 9, 2010
- Kyoto University
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring values of physical property
- Patent number 6,823,724
- Issue date Nov 30, 2004
- Jeol Ltd.
- Kei Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method of soldering using lead-free solder and bonded article prepa...
- Patent number 6,702,175
- Issue date Mar 9, 2004
- Matsushita Electric Industrial Co., Ltd.
- Kazumi Matsushige
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
Scan Device
- Publication number 20110261352
- Publication date Oct 27, 2011
- SHIMADZU CORPORATION
- Masahiro Ohta
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING OUTPUT OF SCANNING TYPE PROBE MICROSCOPE, AN...
- Publication number 20110247107
- Publication date Oct 6, 2011
- KYOTO UNIVERSITY
- Eika Tsunemi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING SURFACE PROPERTIES
- Publication number 20110062964
- Publication date Mar 17, 2011
- Yoshihiro Hosokawa
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT
- Publication number 20100219819
- Publication date Sep 2, 2010
- Kenjiro Kimura
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Irradiation Device
- Publication number 20090127473
- Publication date May 21, 2009
- Kenjiro Kimura
- B82 - NANO-TECHNOLOGY
Information Patent Application
PYROELECTRIC INFRARED SENSOR
- Publication number 20090072143
- Publication date Mar 19, 2009
- Daikin Industries, Ltd.
- Kenji Ishida
- G01 - MEASURING TESTING
Information Patent Application
Molecular Device and Manufacturing Method for the Same
- Publication number 20080119008
- Publication date May 22, 2008
- Yuji Miyato
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Thin film and method for manufacturing same
- Publication number 20060121203
- Publication date Jun 8, 2006
- Kuniko Kimura
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method of soldering lead-free solder, and joined object soldered by...
- Publication number 20040144829
- Publication date Jul 29, 2004
- Kazumi Matsushige
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Kazumi Matsushige

Person

Patents Grantslast 30 patents

Scan device for microscope measurement instrument

Apparatus and method of obtaining field by measurement

Method for processing output of scanning type probe microscope, and...

Electron beam irradiation device

Method and apparatus for measuring values of physical property

Method of soldering using lead-free solder and bonded article prepa...

Patents Applicationslast 30 patents

Scan Device

METHOD FOR PROCESSING OUTPUT OF SCANNING TYPE PROBE MICROSCOPE, AN...

METHOD AND APPARATUS FOR MEASURING SURFACE PROPERTIES

APPARATUS AND METHOD OF OBTAINING FIELD BY MEASUREMENT

Electron Beam Irradiation Device

PYROELECTRIC INFRARED SENSOR

Molecular Device and Manufacturing Method for the Same

Thin film and method for manufacturing same

Method of soldering lead-free solder, and joined object soldered by...