Kazunari ASAO

Person

Tokai, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for image adjustment and charged particle beam system
- Patent number 11,276,552
- Issue date Mar 15, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuki Tomizawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 10,991,542
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryota Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image processing apparatus, image processing method
- Patent number 8,923,614
- Issue date Dec 30, 2014
- Hitachi High-Technologies Corporation
- Hideki Itai
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle microscope
- Patent number 8,859,962
- Issue date Oct 14, 2014
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 8,835,844
- Issue date Sep 16, 2014
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,581,186
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Makoto Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,487,253
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,080,790
- Issue date Dec 20, 2011
- Hitachi High-Technologies Corporation
- Minoru Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,700,918
- Issue date Apr 20, 2010
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,372,028
- Issue date May 13, 2008
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,087,899
- Issue date Aug 8, 2006
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 6,946,656
- Issue date Sep 20, 2005
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for Image Adjustment and Charged Particle Beam System
- Publication number 20210183611
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Yuki TOMIZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam System and Overlay Shift Amount Measurement M...
- Publication number 20210055098
- Publication date Feb 25, 2021
- HITACHI HIGH-TECH CORPORATION
- Takuma YAMAKI
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20190362931
- Publication date Nov 28, 2019
- Hitachi High-Technologies Corporation
- Ryota WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE
- Publication number 20140197313
- Publication date Jul 17, 2014
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD
- Publication number 20130343649
- Publication date Dec 26, 2013
- Hitachi High-Technologies Corporation
- Hideki ITAI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130206986
- Publication date Aug 15, 2013
- Hitachi High-Technologies Corporation
- Makoto SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE MICROSCOPE
- Publication number 20120119087
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Noritsugu Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20120061566
- Publication date Mar 15, 2012
- Hitachi High-Technologies Corporation
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Electrification Measurement Method and Charged Particle Beam...
- Publication number 20100294929
- Publication date Nov 25, 2010
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20090224170
- Publication date Sep 10, 2009
- Minoru YAMAZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20080201091
- Publication date Aug 21, 2008
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20060219918
- Publication date Oct 5, 2006
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20050161600
- Publication date Jul 28, 2005
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20040211899
- Publication date Oct 28, 2004
- Makoto Ezumi
- G01 - MEASURING TESTING

Kazunari ASAO

Person

Patents Grantslast 30 patents

Method for image adjustment and charged particle beam system

Charged particle beam device

Image processing apparatus, image processing method

Charged-particle microscope

Sample electrification measurement method and charged particle beam...

Charged particle beam apparatus

Scanning electron microscope

Scanning electron microscope

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Patents Applicationslast 30 patents

Method for Image Adjustment and Charged Particle Beam System

Charged Particle Beam System and Overlay Shift Amount Measurement M...

Charged Particle Beam Device

CHARGED-PARTICLE MICROSCOPE

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD

CHARGED PARTICLE BEAM APPARATUS

CHARGED-PARTICLE MICROSCOPE

SCANNING ELECTRON MICROSCOPE

Sample Electrification Measurement Method and Charged Particle Beam...

SCANNING ELECTRON MICROSCOPE

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...