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Yokohama, JP
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Patents Grants
last 30 patents
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Patent Grant
Noise checking method and apparatus
Patent number
6,915,249
Issue date
Jul 5, 2005
Fujitsu Limited
Toshiro Sato
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Noise analyzing method and apparatus and storage medium
Patent number
6,662,132
Issue date
Dec 9, 2003
Fujitsu Limited
Yasuhiro Yamashita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Noise analyzing method and apparatus and storage medium
Publication number
20020007253
Publication date
Jan 17, 2002
Yasuhiro Yamashita
G01 - MEASURING TESTING