Kazunari Ishii

Person

Nirasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Device test method
- Patent number 9,891,274
- Issue date Feb 13, 2018
- Tokyo Electron Limited
- Masataka Hatta
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for thermal stabilization of probe card and inspection appar...
- Patent number 9,030,218
- Issue date May 12, 2015
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Wafer chuck inclination correcting method and probe apparatus
- Patent number 8,866,503
- Issue date Oct 21, 2014
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for setting contact parameter and recording medium having pr...
- Patent number 8,395,401
- Issue date Mar 12, 2013
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for calculating height of chuck top and program storage medi...
- Patent number 8,027,528
- Issue date Sep 27, 2011
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Method for registering probe card and a storage medium storing prog...
- Patent number 7,710,135
- Issue date May 4, 2010
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Probing method, probe apparatus and storage medium
- Patent number 7,626,406
- Issue date Dec 1, 2009
- Tokyo Electron Limited
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Grant
Probing method and probing apparatus
- Patent number 7,009,415
- Issue date Mar 7, 2006
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Probing method and probing apparatus in which steady load is applie...
- Patent number 6,777,968
- Issue date Aug 17, 2004
- Tokyo Electron Limted
- Masahito Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe-test method and prober
- Patent number 6,297,656
- Issue date Oct 2, 2001
- Tokyo Electron Limited
- Masahito Kobayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM
- Publication number 20250085348
- Publication date Mar 13, 2025
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TEST METHOD
- Publication number 20160209465
- Publication date Jul 21, 2016
- TOKYO ELECTRON LIMITED
- Masataka HATTA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPAR...
- Publication number 20130278279
- Publication date Oct 24, 2013
- TOKYO ELECTRON LIMITED
- Kazunari Ishii
- G01 - MEASURING TESTING
Information Patent Application
WAFER CHUCK INCLINATION CORRECTING METHOD AND PROBE APPARATUS
- Publication number 20110234247
- Publication date Sep 29, 2011
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SETTING CONTACT PARAMETER AND RECORDING MEDIUM HAVING PR...
- Publication number 20100244876
- Publication date Sep 30, 2010
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR REGISTERING PROBE CARD AND A STORAGE MEDIUM STORING PROG...
- Publication number 20080315904
- Publication date Dec 25, 2008
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
PROBING METHOD, PROBE APPARATUS AND STORAGE MEDIUM
- Publication number 20080238455
- Publication date Oct 2, 2008
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALCULATING HEIGHT OF CHUCK TOP AND PROGRAM STORAGE MEDI...
- Publication number 20080198176
- Publication date Aug 21, 2008
- TOKYO ELECTRON LIMITED
- Kazunari ISHII
- G01 - MEASURING TESTING
Information Patent Application
Probing method and probing apparatus
- Publication number 20040227535
- Publication date Nov 18, 2004
- TOKYO ELECTRON LIMITED
- Masahito Kobayashi
- G01 - MEASURING TESTING

Kazunari Ishii

Person

Patents Grantslast 30 patents

Device test method

Method for thermal stabilization of probe card and inspection appar...

Wafer chuck inclination correcting method and probe apparatus

Method for setting contact parameter and recording medium having pr...

Method for calculating height of chuck top and program storage medi...

Method for registering probe card and a storage medium storing prog...

Probing method, probe apparatus and storage medium

Probing method and probing apparatus

Probing method and probing apparatus in which steady load is applie...

Probe-test method and prober

Patents Applicationslast 30 patents

INFORMATION PROCESSING DEVICE, DISPLAY AND INPUT DEVICE, AND PROGRAM

DEVICE TEST METHOD

METHOD FOR THERMAL STABILIZATION OF PROBE CARD AND INSPECTION APPAR...

WAFER CHUCK INCLINATION CORRECTING METHOD AND PROBE APPARATUS

METHOD FOR SETTING CONTACT PARAMETER AND RECORDING MEDIUM HAVING PR...

METHOD FOR REGISTERING PROBE CARD AND A STORAGE MEDIUM STORING PROG...

PROBING METHOD, PROBE APPARATUS AND STORAGE MEDIUM

METHOD FOR CALCULATING HEIGHT OF CHUCK TOP AND PROGRAM STORAGE MEDI...

Probing method and probing apparatus