Kazunari Suga

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor test apparatus
- Patent number 11,693,049
- Issue date Jul 4, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test apparatus
- Patent number 11,614,350
- Issue date Mar 28, 2023
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Sensor test system
- Patent number 11,460,520
- Issue date Oct 4, 2022
- ADV ANTEST Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system with heating blocks accommodated in cooling blocks
- Patent number 7,554,350
- Issue date Jun 30, 2009
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Burn-in system with heating blocks accommodated in cooling blocks
- Patent number 7,397,258
- Issue date Jul 8, 2008
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for IC testing apparatus
- Patent number 6,292,005
- Issue date Sep 18, 2001
- Advantest Corporatin
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit testing apparatus with reduced ins...
- Patent number 6,184,697
- Issue date Feb 6, 2001
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit testing apparatus with reduced ins...
- Patent number 6,075,372
- Issue date Jun 13, 2000
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board with electronic devices mounted thereon
- Patent number 6,052,284
- Issue date Apr 18, 2000
- Advantest Corporation
- Kazunari Suga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor test system having test head connection apparatus
- Patent number 5,818,219
- Issue date Oct 6, 1998
- Advantest Corp.
- Hiroyuki Hama
- G01 - MEASURING TESTING
Information Patent Grant
Contact mechanism for test head of semiconductor test system
- Patent number 5,754,057
- Issue date May 19, 1998
- Advantest Corp.
- Hiroyuki Hama
- G01 - MEASURING TESTING
Information Patent Grant
Board exchange mechanism for semiconductor test system
- Patent number 5,747,994
- Issue date May 5, 1998
- Advantest Corp.
- Kazunari Suga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR TEST SYSTEM
- Publication number 20200191886
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Application
SENSOR TEST APPARATUS
- Publication number 20200191622
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Application
SENSOR TEST APPARATUS
- Publication number 20200191864
- Publication date Jun 18, 2020
- Advantest Corporation
- Kazunari Suga
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
BURN-IN SYSTEM WITH MEASUREMENT BLOCK ACCOMODATED IN COOLING BLOCK
- Publication number 20090230985
- Publication date Sep 17, 2009
- ADVANTEST Corporation
- Kazunari Suga
- G01 - MEASURING TESTING
Information Patent Application
BURN-IN SYSTEM WITH HEATING BLOCKS ACCOMODATED IN COOLING BLOCKS
- Publication number 20080238465
- Publication date Oct 2, 2008
- Kazunari SUGA
- G01 - MEASURING TESTING
Information Patent Application
Burn-in system
- Publication number 20070057686
- Publication date Mar 15, 2007
- Advantest Corporation
- Kazunari Suga
- G01 - MEASURING TESTING

Kazunari Suga

Person

Patents Grantslast 30 patents

Sensor test apparatus

Sensor test apparatus

Sensor test system

Burn-in system with heating blocks accommodated in cooling blocks

Burn-in system with heating blocks accommodated in cooling blocks

Probe card for IC testing apparatus

Semiconductor integrated circuit testing apparatus with reduced ins...

Semiconductor integrated circuit testing apparatus with reduced ins...

Printed circuit board with electronic devices mounted thereon

Semiconductor test system having test head connection apparatus

Contact mechanism for test head of semiconductor test system

Board exchange mechanism for semiconductor test system

Patents Applicationslast 30 patents

SENSOR TEST SYSTEM

SENSOR TEST APPARATUS

SENSOR TEST APPARATUS

BURN-IN SYSTEM WITH MEASUREMENT BLOCK ACCOMODATED IN COOLING BLOCK

BURN-IN SYSTEM WITH HEATING BLOCKS ACCOMODATED IN COOLING BLOCKS

Burn-in system