TREA

Kazunobu Hayakawa

Follow

Person

  • Chofu, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Spin-polarization detector
    • Patent number 4,954,770
    • Issue date Sep 4, 1990
    • Hitachi, Ltd.
    • Hideo Matsuyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Scanning electron microscope
    • Patent number 4,658,138
    • Issue date Apr 14, 1987
    • Hitachi, Ltd.
    • Kazuyuki Koike
    • H01 - BASIC ELECTRIC ELEMENTS