TREA

Kazunori ANDO

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Sample holder and sample holder set
    • Patent number 9,865,425
    • Issue date Jan 9, 2018
    • Hitachi High-Tech Science Corporation
    • Kazunori Ando
    • G02 - OPTICS
  • Information Patent Grant

    Scanning probe microscope
    • Patent number 9,689,893
    • Issue date Jun 27, 2017
    • Hitachi High-Tech Science Corporation
    • Kazunori Ando
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    SAMPLE HOLDER AND SAMPLE HOLDER SET
    • Publication number 20170062175
    • Publication date Mar 2, 2017
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Kazunori ANDO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SCANNING PROBE MICROSCOPE
    • Publication number 20160356810
    • Publication date Dec 8, 2016
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Kazunori ANDO
    • G01 - MEASURING TESTING