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Kazunori Ando
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Chiba-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
Patent number
8,608,373
Issue date
Dec 17, 2013
SII NanoTechnology Inc.
Kazunori Ando
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and measuring method by means of the same
Patent number
7,251,987
Issue date
Aug 7, 2007
SII NanoTechnology Inc.
Masafumi Watanabe
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscopy system and method of measurement by the same
Patent number
7,098,453
Issue date
Aug 29, 2006
SII NanoTechnology Inc.
Kazunori Ando
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope and operation method
Patent number
6,941,798
Issue date
Sep 13, 2005
SII NanoTechnology Inc.
Takehiro Yamaoka
G01 - MEASURING TESTING
Information
Patent Grant
Method of operating scanning probe microscope
Patent number
6,596,992
Issue date
Jul 22, 2003
Seiko Instruments Inc.
Kazunori Ando
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Softening point measuring apparatus and thermal conductivity measur...
Publication number
20110038392
Publication date
Feb 17, 2011
Kazunori Ando
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope and measuring method by means of the same
Publication number
20050210966
Publication date
Sep 29, 2005
Masafumi Watanabe
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscopy and method of measurement by the same
Publication number
20050189490
Publication date
Sep 1, 2005
Kazunori Ando
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope and operation method
Publication number
20040093935
Publication date
May 20, 2004
Takehiro Yamaoka
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope
Publication number
20020088937
Publication date
Jul 11, 2002
Kazunori Ando
B82 - NANO-TECHNOLOGY