Kazunori HARADA

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor measurement device and method of measuring semiconductor
- Patent number 11,060,990
- Issue date Jul 13, 2021
- TOSHIBA MEMORY CORPORATION
- Jun Hirota
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional non-volatile memory device with cut off time control
- Patent number 10,593,691
- Issue date Mar 17, 2020
- TOSHIBA MEMORY CORPORATION
- Yusuke Umezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conductive probe, electrical property evaluating system, scanning p...
- Patent number 10,466,270
- Issue date Nov 5, 2019
- Kabushiki Kaisha Toshiba
- Kazunori Harada
- G01 - MEASURING TESTING
Information Patent Grant
Variable resistance element and memory device
- Patent number 10,164,180
- Issue date Dec 25, 2018
- TOSHIBA MEMORY CORPORATION
- Hiromichi Kuriyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscope
- Patent number 9,410,983
- Issue date Aug 9, 2016
- Kabushiki Kaisha Toshiba
- Hideo Shinomiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20190296044
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Kazunori HARADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR
- Publication number 20190293586
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE
- Publication number 20190198517
- Publication date Jun 27, 2019
- Toshiba Memory Corporation
- Yusuke Umezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VARIABLE RESISTANCE ELEMENT AND MEMORY DEVICE
- Publication number 20180145251
- Publication date May 24, 2018
- Toshiba Memory Corporation
- Hiromichi KURIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONDUCTIVE PROBE, ELECTRICAL PROPERTY EVALUATING SYSTEM, SCANNING P...
- Publication number 20180074093
- Publication date Mar 15, 2018
- KABUSHIKI KAISHA TOSHIBA
- Kazunori HARADA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD OF SCANNING PROBE MICROSCOPY
- Publication number 20160377651
- Publication date Dec 29, 2016
- Kabushiki Kaisha Toshiba
- Jun HIROTA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150059025
- Publication date Feb 26, 2015
- Kabushiki Kaisha Toshiba
- Hideo SHINOMIYA
- G01 - MEASURING TESTING

Kazunori HARADA

Person

Patents Grantslast 30 patents

Semiconductor measurement device and method of measuring semiconductor

Three-dimensional non-volatile memory device with cut off time control

Conductive probe, electrical property evaluating system, scanning p...

Variable resistance element and memory device

Scanning probe microscope

Patents Applicationslast 30 patents

SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME

SEMICONDUCTOR MEASUREMENT DEVICE AND METHOD OF MEASURING SEMICONDUCTOR

SEMICONDUCTOR MEMORY DEVICE

VARIABLE RESISTANCE ELEMENT AND MEMORY DEVICE

CONDUCTIVE PROBE, ELECTRICAL PROPERTY EVALUATING SYSTEM, SCANNING P...

MEASURING METHOD OF SCANNING PROBE MICROSCOPY

SCANNING PROBE MICROSCOPE