Kazunori Hikone

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Naka-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,190,593
- Issue date Mar 13, 2007
- Renesas Technology Corporation
- Kiyoshi Aiki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and its analyzing method
- Patent number 7,036,060
- Issue date Apr 25, 2006
- Hitachi, Ltd.
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having self test function
- Patent number 6,640,198
- Issue date Oct 28, 2003
- Hitachi, Ltd.
- Masahide Miyazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for making test data and method thereof
- Patent number 6,317,853
- Issue date Nov 13, 2001
- Hitachi, Ltd.
- Kazunori Hikone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for making test data and method thereof
- Patent number 6,032,280
- Issue date Feb 29, 2000
- Hitachi, Ltd.
- Kazunori Hikone

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and its analyzing method
- Publication number 20030200492
- Publication date Oct 23, 2003
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Application
Cell having scan functions and a test circuit of a semiconductor in...
- Publication number 20020184583
- Publication date Dec 5, 2002
- Hitachi, Ltd.
- Kazunori Hikone
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having self test function
- Publication number 20020128794
- Publication date Sep 12, 2002
- Masahide Miyazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20020117729
- Publication date Aug 29, 2002
- Kiyoshi Aiki
- G01 - MEASURING TESTING