Kazunori Masuda

Person

Yokkaichi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and test method of semiconductor device
- Patent number 11,892,503
- Issue date Feb 6, 2024
- Toshiba Tec Kabushiki Kaisha
- Takuya Kusaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,483,207
- Issue date Nov 19, 2019
- TOSHIBA MEMORY CORPORATION
- Masatoshi Watarai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating semiconductor device
- Patent number 9,842,766
- Issue date Dec 12, 2017
- TOSHIBA MEMORY CORPORATION
- Masato Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,705,009
- Issue date Jul 11, 2017
- Kabushiki Kaisha Toshiba
- Norihisa Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 8,791,517
- Issue date Jul 29, 2014
- Kabushiki Kaisha Toshiba
- Hiroyuki Kutsukake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 8,022,463
- Issue date Sep 20, 2011
- Kabushiki Kaisha Toshiba
- Kazunori Masuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,094,652
- Issue date Aug 22, 2006
- Kabushiki Kaisha Toshiba
- Hiroshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 6,806,540
- Issue date Oct 19, 2004
- Kabushiki Kaisha Toshiba
- Hiroshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact structure of semiconductor device
- Patent number 6,107,670
- Issue date Aug 22, 2000
- Kabushiki Kaisha Toshiba
- Kazunori Masuda
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND TEST METHOD OF SEMICONDUCTOR DEVICE
- Publication number 20230296669
- Publication date Sep 21, 2023
- KIOXIA Corporation
- Takuya KUSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180040565
- Publication date Feb 8, 2018
- Toshiba Memory Corporation
- Masatoshi WATARAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING...
- Publication number 20160078940
- Publication date Mar 17, 2016
- KABUSHIKI KAISHA TOSHIBA
- Naoya KAMI
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20160056067
- Publication date Feb 25, 2016
- KABUSHIKI KAISHA TOSHIBA
- Masato ENDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20140284690
- Publication date Sep 25, 2014
- KABUSHIKI KAISHA TOSHIBA
- Norihisa Arai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20120032243
- Publication date Feb 9, 2012
- Hiroyuki KUTSUKAKE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
- Publication number 20110001180
- Publication date Jan 6, 2011
- Kazunori MASUDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20100006917
- Publication date Jan 14, 2010
- Kabushiki Kaisha Toshiba
- Kazunori Masuda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20040203207
- Publication date Oct 14, 2004
- Hiroshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20020041000
- Publication date Apr 11, 2002
- Hiroshi Watanabe
- H01 - BASIC ELECTRIC ELEMENTS

Kazunori Masuda

Person

Patents Grantslast 30 patents

Semiconductor device and test method of semiconductor device

Semiconductor device

Semiconductor device and method for fabricating semiconductor device

Semiconductor device

Semiconductor device

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same

Contact structure of semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND TEST METHOD OF SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING...

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

NONVOLATILE SEMICONDUCTOR MEMORY DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

Semiconductor device and method of manufacturing the same

Semiconductor device and method of manufacturing the same