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Kazunori Nemoto
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Aklshima, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inspecting apparatus and an inspecting method
Patent number
8,831,899
Issue date
Sep 9, 2014
Hitachi High-Technologies Corporation
Kazunori Nemoto
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Semiconductor defect classifying method, semiconductor defect class...
Patent number
8,595,666
Issue date
Nov 26, 2013
Hitachi High-Technologies Corporation
Koichi Hayakawa
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and method for manufacturing electronic devices u...
Patent number
6,611,728
Issue date
Aug 26, 2003
Hitachi, Ltd.
Natsuyo Morioka
G01 - MEASURING TESTING
Information
Patent Grant
Electric device inspection method and electric device inspection sy...
Patent number
6,539,272
Issue date
Mar 25, 2003
Hitachi, Ltd.
Makoto Ono
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEFECT CLASSIFYING METHOD, SEMICONDUCTOR DEFECT CLASS...
Publication number
20120131529
Publication date
May 24, 2012
Hitachi High-Technologies Corporation
Koichi Hayakawa
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE WAFER FOR CALIBRATION OF DARK-FIELD INSPECTION APPARATUS,...
Publication number
20110276299
Publication date
Nov 10, 2011
Kazunori Nemoto
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method for semiconductor device and semiconductor man...
Publication number
20050233554
Publication date
Oct 20, 2005
Toshihito Tsuga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wet processing apparatus, wet processing method and manufacturing m...
Publication number
20040262265
Publication date
Dec 30, 2004
TRECENTI TECHNOLOGIES, INC
Michimasa Funabashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Manufacturing method of semiconductor devices
Publication number
20040063263
Publication date
Apr 1, 2004
Norio Suzuki
H01 - BASIC ELECTRIC ELEMENTS