Kazunori Ninomiya

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Matsuyama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Enclosure inspection method and apparatus thereof
- Patent number 7,697,745
- Issue date Apr 13, 2010
- Riken
- Chiko Otani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Enclosure inspection method and apparatus thereof
- Publication number 20070009085
- Publication date Jan 11, 2007
- Chiko Otani
- G01 - MEASURING TESTING