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Kazunori Yamazawa
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Mito, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer and method thereof
Patent number
12,216,134
Issue date
Feb 4, 2025
HITACHI HIGH-TECH CORPORATION
Takaaki Hagiwara
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis apparatus
Patent number
11,860,179
Issue date
Jan 2, 2024
HITACHI HIGH-TECH CORPORATION
Ayaka Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analysis apparatus
Patent number
11,555,824
Issue date
Jan 17, 2023
HITACHI HIGH-TECH CORPORATION
Ayaka Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,958,468
Issue date
May 1, 2018
Hitachi High-Technologies Corporation
Yoshihiro Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer and reagent processing method in automatic analyzer
Patent number
9,709,587
Issue date
Jul 18, 2017
Hitachi High-Technologies Corporation
Takaaki Hagiwara
G01 - MEASURING TESTING
Information
Patent Grant
Immunological analyzing apparatus
Patent number
9,494,611
Issue date
Nov 15, 2016
Hitachi High-Technologies Corporation
Takaaki Hagiwara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Automatic Analysis Apparatus
Publication number
20230095937
Publication date
Mar 30, 2023
HITACHI HIGH-TECH CORPORATION
Ayaka HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER AND METHOD THEREOF
Publication number
20220011326
Publication date
Jan 13, 2022
Takaaki HAGIWARA
G01 - MEASURING TESTING
Information
Patent Application
Automatic Analysis Apparatus
Publication number
20200233001
Publication date
Jul 23, 2020
Hitachi High-Tech Corporation
Ayaka HASHIMOTO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20160154016
Publication date
Jun 2, 2016
Hitachi High-Technologies Corporation
Yoshihiro YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
IMMUNOLOGICAL ANALYZING APPARATUS
Publication number
20150212102
Publication date
Jul 30, 2015
Hitachi High-Technologies Corporation
Takaaki HAGIWARA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYSIS DEVICE AND REAGENT PROCESSING METHOD IN AUTOMATI...
Publication number
20140356233
Publication date
Dec 4, 2014
Hitachi High-Technologies Corporation
Takaaki Hagiwara
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20120251391
Publication date
Oct 4, 2012
Hitachi High-Technologies Corporation
Takaaki Hagiwara
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20110293477
Publication date
Dec 1, 2011
Kazunori Yamazawa
G01 - MEASURING TESTING