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Kazuo Aita
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Amagasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for acquiring image and ion beam apparatus
Patent number
10,276,343
Issue date
Apr 30, 2019
Tomokazu Kozakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for acquiring image and ion beam apparatus
Patent number
10,014,157
Issue date
Jul 3, 2018
Hitachi High-Tech Science Corporation
Tomokazu Kozakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus
Patent number
9,793,085
Issue date
Oct 17, 2017
Hitachi High-Tech Science Corporation
Anto Yasaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
Patent number
9,773,634
Issue date
Sep 26, 2017
Hitachi High-Tech Science Corporation
Tomokazu Kozakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Iridium tip, gas field ion source, focused ion beam apparatus, elec...
Patent number
9,583,299
Issue date
Feb 28, 2017
Hitachi High-Tech Science Corporation
Tomokazu Kozakai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Repair apparatus
Patent number
9,378,858
Issue date
Jun 28, 2016
Hitachi High-Tech Science Corporation
Fumio Aramaki
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for fabricating emitter
Patent number
8,999,178
Issue date
Apr 7, 2015
Hitachi High-Tech Science Corporation
Yasuhiko Sugiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating emitter
Patent number
8,764,994
Issue date
Jul 1, 2014
Hitachi High-Tech Science Corporation
Yasuhiko Sugiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Composite focused ion beam device, process observation method using...
Patent number
8,274,063
Issue date
Sep 25, 2012
SII NanoTechnology Inc.
Takashi Kaito
G01 - MEASURING TESTING
Information
Patent Grant
Composite focused ion beam device, and processing observation metho...
Patent number
8,269,194
Issue date
Sep 18, 2012
SII NanoTechnology Inc.
Takashi Kaito
G01 - MEASURING TESTING
Information
Patent Grant
Ion beam processing method
Patent number
7,323,685
Issue date
Jan 29, 2008
SII Nano Technology Inc.
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for extracting objective image
Patent number
7,103,209
Issue date
Sep 5, 2006
SII NanoTechnology Inc.
Kazuo Aita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image sensor having uniform sensitivity
Patent number
6,864,475
Issue date
Mar 8, 2005
Mitsubishi Denki Kabushiki Kaisha
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam apparatus
Patent number
6,642,512
Issue date
Nov 4, 2003
Seiko Instruments Inc.
Kazuo Aita
G01 - MEASURING TESTING
Information
Patent Grant
Black defect correction method and black defect correction device f...
Patent number
6,544,692
Issue date
Apr 8, 2003
Seiko Instruments Inc.
Osamu Takaoka
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Photomask correction device
Patent number
6,467,426
Issue date
Oct 22, 2002
Seiko Instruments Inc.
Osamu Takaoka
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Focused ion beam forming method
Patent number
6,392,230
Issue date
May 21, 2002
Seiko Instruments Inc.
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam processing apparatus
Patent number
6,365,905
Issue date
Apr 2, 2002
Seiko Instruments Inc.
Yoshihiro Koyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Observing/forming method with focused ion beam and apparatus therefor
Patent number
6,281,496
Issue date
Aug 28, 2001
Seiko Instruments Inc.
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion beam machining method and device thereof
Patent number
5,854,488
Issue date
Dec 29, 1998
Seiko Instruments Inc.
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for correcting a patterned film using an ion beam
Patent number
5,405,734
Issue date
Apr 11, 1995
Seiko Instruments Inc.
Kazuo Aita
G02 - OPTICS
Information
Patent Grant
Method and apparatus for determining the shape of wire or like article
Patent number
4,942,618
Issue date
Jul 17, 1990
Mitsubishi Denki Kabushiki Kaisha
Kazuhiko Sumi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR ACQUIRING IMAGE AND ION BEAM APPARATUS
Publication number
20180269029
Publication date
Sep 20, 2018
HITACHI HIGH-TECH SCIENCE CORPORATION
Tomokazu KOZAKAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
Publication number
20170148603
Publication date
May 25, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Tomokazu Kozakai
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ACQUIRING IMAGE AND ION BEAM APPARATUS
Publication number
20170092461
Publication date
Mar 30, 2017
HITACHI HIGH-TECH SCIENCE CORPORATION
Tomokazu KOZAKAI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Repair Apparatus
Publication number
20160322123
Publication date
Nov 3, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Fumio Aramaki
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
FOCUSED ION BEAM APPARATUS
Publication number
20160225574
Publication date
Aug 4, 2016
HITACHI HIGH-TECH SCIENCE CORPORATION
Anto YASAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Repair Apparatus
Publication number
20150053866
Publication date
Feb 26, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Fumio Aramaki
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Elec...
Publication number
20150047079
Publication date
Feb 12, 2015
HITACHI HIGH-TECH SCIENCE CORPORATION
Tomokazu Kozakai
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR FABRICATING EMITTER
Publication number
20140246397
Publication date
Sep 4, 2014
HITACHI HIGH-TECH SCIENCE CORPORATION
Yasuhiko SUGIYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FABRICATING EMITTER
Publication number
20130248483
Publication date
Sep 26, 2013
HITACHI HIGH-TECH SCIENCE CORPORATION
Yasuhiko SUGIYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, PROCESS OBSERVATION METHOD USING...
Publication number
20100288924
Publication date
Nov 18, 2010
Takashi Kaito
G01 - MEASURING TESTING
Information
Patent Application
COMPOSITE FOCUSED ION BEAM DEVICE, AND PROCESSING OBSERVATION METHO...
Publication number
20100176296
Publication date
Jul 15, 2010
Takashi Kaito
G01 - MEASURING TESTING
Information
Patent Application
Ion beam processing method
Publication number
20060097194
Publication date
May 11, 2006
Kazuo Aita
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Defect correction method for a photomask
Publication number
20040209172
Publication date
Oct 21, 2004
Osamu Takaoka
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Glass substrate processing method
Publication number
20020121109
Publication date
Sep 5, 2002
Kazuo Aita
C03 - GLASS MINERAL OR SLAG WOOL
Information
Patent Application
Focused ion beam apparatus
Publication number
20020100871
Publication date
Aug 1, 2002
Kazuo Aita
G01 - MEASURING TESTING