Kazuo Chinone

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Radiation analysis apparatus
- Patent number 10,908,104
- Issue date Feb 2, 2021
- Hitachi High-Tech Science Corporation
- Satoshi Nakayama
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Radiation analyzing apparatus and radiation analyzing method
- Patent number 10,801,977
- Issue date Oct 13, 2020
- Hitachi High-Tech Science Corporation
- Atsushi Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and probe contact detection method
- Patent number 10,151,773
- Issue date Dec 11, 2018
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer
- Patent number 10,048,216
- Issue date Aug 14, 2018
- Hitachi High-Tech Science Corporation
- Keiichi Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis device
- Patent number 10,018,578
- Issue date Jul 10, 2018
- Hitachi High-Tech Science Corporation
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 6,974,952
- Issue date Dec 13, 2005
- SII NanoTechnology Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive method of quantitatively evaluating degree of plasti...
- Patent number 6,111,405
- Issue date Aug 29, 2000
- Seiko Instruments Inc.
- Hiroshi Yamakawa
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting quantum interference device and non-destructive eva...
- Patent number 6,025,713
- Issue date Feb 15, 2000
- Seiko Instruments Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting plastic deformation in steel using a differenti...
- Patent number 5,982,172
- Issue date Nov 9, 1999
- Seiko Instruments Inc.
- Noboru Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Superconducting quantum interference device fluxmeter and nondestru...
- Patent number 5,854,492
- Issue date Dec 29, 1998
- Seiko Instruments Inc.
- Kazuo Chinone
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection apparatus with superconducting magnetic s...
- Patent number 5,834,938
- Issue date Nov 10, 1998
- Seiko Instruments Inc.
- Akikazu Odawara
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive testing system using a SQUID
- Patent number 5,825,182
- Issue date Oct 20, 1998
- Seiko Instruments Inc.
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Radial differential squid magnetic flux meter
- Patent number 5,825,183
- Issue date Oct 20, 1998
- Seiko Instruments Inc.
- Toshimitsu Morooka
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing DC superconducting quantum interference d...
- Patent number 5,306,521
- Issue date Apr 26, 1994
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Radiation Analysis Apparatus
- Publication number 20190033237
- Publication date Jan 31, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Radiation Analyzing Apparatus
- Publication number 20180275079
- Publication date Sep 27, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROBE CONTACT DETECTION METHOD
- Publication number 20170285067
- Publication date Oct 5, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
RADIATION ANALYZING APPARATUS AND RADIATION ANALYZING METHOD
- Publication number 20170276621
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Nagata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20170269012
- Publication date Sep 21, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS DEVICE
- Publication number 20170062088
- Publication date Mar 2, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi Nakayama
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20160231259
- Publication date Aug 11, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Keiichi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Radiation detector
- Publication number 20040011960
- Publication date Jan 22, 2004
- Toshimitsu Morooka
- G01 - MEASURING TESTING

Kazuo Chinone

Person

Patents Grantslast 30 patents

Radiation analysis apparatus

Radiation analyzing apparatus and radiation analyzing method

Scanning probe microscope and probe contact detection method

X-ray analyzer

X-ray analysis device

Radiation detector

Nondestructive method of quantitatively evaluating degree of plasti...

Superconducting quantum interference device and non-destructive eva...

Method of detecting plastic deformation in steel using a differenti...

Superconducting quantum interference device fluxmeter and nondestru...

Nondestructive inspection apparatus with superconducting magnetic s...

Nondestructive testing system using a SQUID

Radial differential squid magnetic flux meter

Process for manufacturing DC superconducting quantum interference d...

Patents Applicationslast 30 patents

Radiation Analysis Apparatus

Radiation Analyzing Apparatus

SCANNING PROBE MICROSCOPE AND PROBE CONTACT DETECTION METHOD

RADIATION ANALYZING APPARATUS AND RADIATION ANALYZING METHOD

X-RAY ANALYZER

X-RAY ANALYSIS DEVICE

X-RAY ANALYZER

Radiation detector