Kazuo HENMI

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device, electronic circuit, and method of inspecting...
- Patent number 10,746,812
- Issue date Aug 18, 2020
- Renesas Electronics Corporation
- Kazuo Henmi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 10,115,684
- Issue date Oct 30, 2018
- Renesas Electronics Corporation
- Shinpei Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 9,589,887
- Issue date Mar 7, 2017
- Renesas Electronics Corporation
- Shinpei Watanabe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC CIRCUIT, AND METHOD OF INSPECTING...
- Publication number 20200072891
- Publication date Mar 5, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuo HENMI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20170148751
- Publication date May 25, 2017
- RENESAS ELECTRONICS CORPORATION
- Shinpei WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160093570
- Publication date Mar 31, 2016
- RENESAS ELECTRONICS CORPORATION
- Shinpei WATANABE
- H01 - BASIC ELECTRIC ELEMENTS