Kazuo Kajitani

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical system for microscope, and microscope in which same is used
- Patent number 11,378,792
- Issue date Jul 5, 2022
- MIL-KIN INC.
- Kiyofumi Kano
- G02 - OPTICS
Information Patent Grant
Focusing method, measuring method, principal point detecting method...
- Patent number 10,705,325
- Issue date Jul 7, 2020
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Sample shape measuring method and sample shape measuring apparatus
- Patent number 10,458,781
- Issue date Oct 29, 2019
- Olympus Corporation
- Mayumi Odaira
- G02 - OPTICS
Information Patent Grant
Sample observation device and sample observation method
- Patent number 10,133,050
- Issue date Nov 20, 2018
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Observation unit and microscope system equipped with observation unit
- Patent number 9,671,604
- Issue date Jun 6, 2017
- Olympus Corporation
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Microscope objective lens
- Patent number 9,170,413
- Issue date Oct 27, 2015
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Microscope optical system
- Patent number 8,964,285
- Issue date Feb 24, 2015
- Olympus Corporation
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Inverted microscope
- Patent number 8,928,974
- Issue date Jan 6, 2015
- Olympus Corporation
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Microscope objective lens
- Patent number 8,928,987
- Issue date Jan 6, 2015
- Olympus Corporation
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Grant
Microscope objective lens and microscope using the same
- Patent number 6,441,966
- Issue date Aug 27, 2002
- Olympus Optical Co., Ltd.
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Microscope apparatus
- Patent number 6,323,998
- Issue date Nov 27, 2001
- Olympus Optical Co., Ltd.
- Yoshihiro Kawano
- G02 - OPTICS
Information Patent Grant
Microscope illumination optical system and microscope having the same
- Patent number 6,212,005
- Issue date Apr 3, 2001
- Olympus Optical Co., Ltd.
- Kenji Kawasaki
- G02 - OPTICS
Information Patent Grant
Microscope with chromatic aberration correcting function
- Patent number 6,052,223
- Issue date Apr 18, 2000
- Olympus Optical Co., Ltd.
- Takashi Yoneyama
- G02 - OPTICS
Information Patent Grant
Microscope apparatus
- Patent number 5,808,791
- Issue date Sep 15, 1998
- Olympus Optical Co., Ltd.
- Yoshihiro Kawano
- G02 - OPTICS
Information Patent Grant
Microscope
- Patent number 5,777,783
- Issue date Jul 7, 1998
- Olympus Optical Co., Ltd.
- Itaru Endou
- G02 - OPTICS
Information Patent Grant
Illumination optical system for microscopes
- Patent number 5,654,832
- Issue date Aug 5, 1997
- Olympus Optical Co., Ltd.
- Kenji Kawasaki
- G02 - OPTICS
Information Patent Grant
Reflected fluorescence microscope
- Patent number 5,371,624
- Issue date Dec 6, 1994
- Olympus Optical Co., Ltd.
- Takashi Nagano
- G02 - OPTICS
Information Patent Grant
Noninverting photo-microscope with variable power lenses
- Patent number 4,834,516
- Issue date May 30, 1989
- Olympus Optical Co., Ltd.
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Active focus detecting device with infrared source
- Patent number 4,734,570
- Issue date Mar 29, 1988
- Olympus Optical Co., Ltd.
- Yoshiaki Horikawa
- G02 - OPTICS
Information Patent Grant
Lens system for optical disks
- Patent number 4,655,556
- Issue date Apr 7, 1987
- Olympus Optical Co., Ltd.
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Grant
Objective for a binocular stereomicroscope
- Patent number 4,640,586
- Issue date Feb 3, 1987
- Olympus Optical Co., Ltd.
- Yoichi Iba
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPHERICAL ABERRATION ADJUSTMENT METHOD FOR OBJECTIVE OPTICAL SYSTEM...
- Publication number 20230125120
- Publication date Apr 27, 2023
- TOKYO SEIMITSU CO., LTD.
- Kazuo KAJITANI
- G02 - OPTICS
Information Patent Application
OPTICAL SYSTEM FOR MICROSCOPE, AND MICROSCOPE IN WHICH SAME IS USED
- Publication number 20200379228
- Publication date Dec 3, 2020
- AQUA SYSTEM Co., Ltd.
- Kiyofumi Kano
- G02 - OPTICS
Information Patent Application
SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS
- Publication number 20180313643
- Publication date Nov 1, 2018
- OLYMPUS CORPORATION
- Mayumi ODAIRA
- G01 - MEASURING TESTING
Information Patent Application
FOCUSING METHOD, MEASURING METHOD, PRINCIPAL POINT DETECTING METHOD...
- Publication number 20160357002
- Publication date Dec 8, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20160048011
- Publication date Feb 18, 2016
- OLYMPUS CORPORATION
- Yoshimasa SUZUKI
- G02 - OPTICS
Information Patent Application
Observation Unit and Microscope System Equipped with Observation Unit
- Publication number 20150070484
- Publication date Mar 12, 2015
- OLYMPUS CORPORATION
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Application
Microscope Objective Lens
- Publication number 20130194660
- Publication date Aug 1, 2013
- OLYMPUS CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Microscope Objective Lens
- Publication number 20130194678
- Publication date Aug 1, 2013
- OLYMPUS CORPORATION
- Yoshimasa Suzuki
- G02 - OPTICS
Information Patent Application
Inverted Microscope
- Publication number 20130128345
- Publication date May 23, 2013
- OLYMPUS CORPORATION
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Application
MICROSCOPE OPTICAL SYSTEM
- Publication number 20120243078
- Publication date Sep 27, 2012
- OLYMPUS CORPORATION
- Kazuo Kajitani
- G02 - OPTICS
Information Patent Application
Microscope objective and microscope using the same
- Publication number 20020008903
- Publication date Jan 24, 2002
- Kazuo Kajitani
- G02 - OPTICS

Kazuo Kajitani

Person

Patents Grantslast 30 patents

Optical system for microscope, and microscope in which same is used

Focusing method, measuring method, principal point detecting method...

Sample shape measuring method and sample shape measuring apparatus

Sample observation device and sample observation method

Observation unit and microscope system equipped with observation unit

Microscope objective lens

Microscope optical system

Inverted microscope

Microscope objective lens

Microscope objective lens and microscope using the same

Microscope apparatus

Microscope illumination optical system and microscope having the same

Microscope with chromatic aberration correcting function

Microscope apparatus

Microscope

Illumination optical system for microscopes

Reflected fluorescence microscope

Noninverting photo-microscope with variable power lenses

Active focus detecting device with infrared source

Lens system for optical disks

Objective for a binocular stereomicroscope

Patents Applicationslast 30 patents

SPHERICAL ABERRATION ADJUSTMENT METHOD FOR OBJECTIVE OPTICAL SYSTEM...

OPTICAL SYSTEM FOR MICROSCOPE, AND MICROSCOPE IN WHICH SAME IS USED

SAMPLE SHAPE MEASURING METHOD AND SAMPLE SHAPE MEASURING APPARATUS

FOCUSING METHOD, MEASURING METHOD, PRINCIPAL POINT DETECTING METHOD...

SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

Observation Unit and Microscope System Equipped with Observation Unit

Microscope Objective Lens

Microscope Objective Lens

Inverted Microscope

MICROSCOPE OPTICAL SYSTEM

Microscope objective and microscope using the same