Kazuo Koyanagi

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Kyoto, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction apparatus and method
- Patent number 6,516,047
- Issue date Feb 4, 2003
- Shimadzu Corporation
- Kazuo Koyanagi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY STRESS MEASUREMENT DEVICE
- Publication number 20210003462
- Publication date Jan 7, 2021
- Shimadzu Corporation
- Yasuyuki OKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
X-ray diffraction apparatus and method
- Publication number 20020003857
- Publication date Jan 10, 2002
- Kazuo Koyanagi
- G01 - MEASURING TESTING