Kazuo Moriya

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defective particle measuring apparatus and defective particle measu...
- Patent number 7,633,617
- Issue date Dec 15, 2009
- Raytex Corporation
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Observation apparatus for observing a defect in a moving target obj...
- Patent number 6,760,060
- Issue date Jul 6, 2004
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Defect evaluation apparatus for evaluating defects and shape inform...
- Patent number 6,236,056
- Issue date May 22, 2001
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for observing defect having marks making means
- Patent number 6,118,133
- Issue date Sep 12, 2000
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus
- Patent number 5,995,216
- Issue date Nov 30, 1999
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 5,982,922
- Issue date Nov 9, 1999
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for the inspection of scattered resist
- Patent number 5,892,241
- Issue date Apr 6, 1999
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting repetitive patterns
- Patent number 5,808,744
- Issue date Sep 15, 1998
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Wiring pattern line width measuring apparatus
- Patent number 5,748,320
- Issue date May 5, 1998
- Mitsui Mining & Smelting Co. Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring size of particle or defect
- Patent number 5,471,298
- Issue date Nov 28, 1995
- Mitsui Minings & Melting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for three-dimensional detection of particles
- Patent number 5,428,655
- Issue date Jun 27, 1995
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate internal defect and external particle detecting apparatus...
- Patent number 5,424,536
- Issue date Jun 13, 1995
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring photoluminescence in crystal
- Patent number 5,381,016
- Issue date Jan 10, 1995
- Mitsui Minings & Melting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting the surface of materials
- Patent number 5,298,963
- Issue date Mar 29, 1994
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring internal defects for position an...
- Patent number 5,196,716
- Issue date Mar 23, 1993
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantitative evaluation method of optical absorption ima...
- Patent number 5,077,475
- Issue date Dec 31, 1991
- Mitsui Mining & Smelting Co., Ltd.
- Kazuo Moriya
- G01 - MEASURING TESTING
Information Patent Grant
Solid state laser hosts
- Patent number 4,765,925
- Issue date Aug 23, 1988
- Mitsui Mining & Smelting Co. Ltd.
- Yutaka Anzai
- C30 - CRYSTAL GROWTH
Information Patent Grant
Pneumatic metal sampler
- Patent number 4,179,931
- Issue date Dec 25, 1979
- Falk; Richard A.
- Kazuo Moriya
- G01 - MEASURING TESTING

Kazuo Moriya

Person

Patents Grantslast 30 patents

Defective particle measuring apparatus and defective particle measu...

Observation apparatus for observing a defect in a moving target obj...

Defect evaluation apparatus for evaluating defects and shape inform...

Apparatus and method for observing defect having marks making means

Pattern inspection apparatus

Pattern inspection apparatus and method

Apparatus and method for the inspection of scattered resist

Apparatus for inspecting repetitive patterns

Wiring pattern line width measuring apparatus

Method and apparatus for measuring size of particle or defect

Method and apparatus for three-dimensional detection of particles

Substrate internal defect and external particle detecting apparatus...

Method and apparatus for measuring photoluminescence in crystal

Apparatus for inspecting the surface of materials

Method and apparatus for measuring internal defects for position an...

Method for quantitative evaluation method of optical absorption ima...

Solid state laser hosts

Pneumatic metal sampler