TREA

Kazuo Nakayama

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  • Hyogo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic flaw detection device
    • Patent number 4,562,738
    • Issue date Jan 7, 1986
    • Mitsubishi Denki Kabushiki Kaisha
    • Kazuo Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic flaw detection device
    • Patent number 4,554,835
    • Issue date Nov 26, 1985
    • Mitsubishi Denki Kabushiki Kaisha
    • Toshio Sakuragi
    • G01 - MEASURING TESTING