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Kazuo Nakazato
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Nagoya, JP
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last 30 patents
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Patent Grant
Material detector
Patent number
8,129,978
Issue date
Mar 6, 2012
National University Corporation Nagoya University
Kazuo Nakazato
G01 - MEASURING TESTING
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Patent Grant
Longitudinal MISFET manufacturing method, longitudinal MISFET, semi...
Patent number
7,244,977
Issue date
Jul 17, 2007
Elpida Memory, Inc.
Tsuyoshi Tabata
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
REFERENCE ELECTRODE HOLDING MEMBER AND SUBSTANCE DETECTION DEVICE
Publication number
20180180566
Publication date
Jun 28, 2018
NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
Kazuo NAKAZATO
G01 - MEASURING TESTING
Information
Patent Application
Vertical misfet manufacturing method, vertical misfet, semiconducto...
Publication number
20070202638
Publication date
Aug 30, 2007
Tsuyoshi Tabata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Longitudinal misfet manufacturing method, Longitudinal misfet, semi...
Publication number
20060035434
Publication date
Feb 16, 2006
Tsuyoshi Tabata
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nanotube transistor device
Publication number
20050051805
Publication date
Mar 10, 2005
Byong Man Kim
G11 - INFORMATION STORAGE