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Kazuo Nishihagi
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Neyagawa, JP
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last 30 patents
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Patent Grant
Surface defect evaluating apparatus
Patent number
5,568,531
Issue date
Oct 22, 1996
Technos Co., Ltd.
Kazuo Nishihagi
G01 - MEASURING TESTING
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Patent Grant
Total reflection X-ray fluorescence apparatus
Patent number
5,249,216
Issue date
Sep 28, 1993
Sumitomo Electric Industries, Ltd.
Tetsuya Ohsugi
G01 - MEASURING TESTING
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Patent Grant
Total reflection X-ray fluorescence apparatus
Patent number
5,220,591
Issue date
Jun 15, 1993
Sumitomo Electric Industries, Ltd.
Tetsuya Ohsugi
G01 - MEASURING TESTING
Information
Patent Grant
Total reflection X-ray fluorescence apparatus
Patent number
5,109,396
Issue date
Apr 28, 1992
Sumitomo Electric Industries, Ltd.
Tetsuya Ohsugi