Kazuo Okubo

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron beam tester
- Patent number 5,872,862
- Issue date Feb 16, 1999
- Fujitsu Limited
- Kazuo Okubo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam tester
- Patent number 5,825,912
- Issue date Oct 20, 1998
- Fujitsu Limited
- Kazuo Okubo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit pattern inspecting device and method and circuit pattern ar...
- Patent number 5,641,960
- Issue date Jun 24, 1997
- Fujitsu Limited
- Kazuo Okubo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron beam tester
- Patent number 5,600,734
- Issue date Feb 4, 1997
- Fujitsu Limited
- Kazuo Okubo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of measuring a voltage with an electron beam apparatus
- Patent number 5,416,426
- Issue date May 16, 1995
- Fujitsu Limited
- Kazuo Okubo
- G01 - MEASURING TESTING
Information Patent Grant
Probing device and system for testing an integrated circuit
- Patent number 5,331,275
- Issue date Jul 19, 1994
- Fujitsu Limited
- Kazuyuki Ozaki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of measuring a voltage with an electron beam apparatus
- Patent number 5,300,880
- Issue date Apr 5, 1994
- Fujitsu Limited
- Kazuo Okubo
- G01 - MEASURING TESTING