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Kazuo Saitoh
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Magnetic immunoassay system
Patent number
8,945,469
Issue date
Feb 3, 2015
Hitachi, Ltd.
Akira Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Immunoassay system and immunoassay method
Patent number
7,993,581
Issue date
Aug 9, 2011
Hitachi, Ltd.
Yusuke Seki
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance measurement apparatus and measuring meth...
Patent number
7,898,256
Issue date
Mar 1, 2011
Hitachi, Ltd.
Isao Kitagawa
G01 - MEASURING TESTING
Information
Patent Grant
Probe for NMR measurement
Patent number
7,808,242
Issue date
Oct 5, 2010
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance spectrometer
Patent number
7,639,014
Issue date
Dec 29, 2009
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
NMR probe and NMR spectrometer
Patent number
7,619,414
Issue date
Nov 17, 2009
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Probe configured for NMR apparatus and NMR apparatus using the same
Patent number
7,609,064
Issue date
Oct 27, 2009
Hitachi, Ltd.
Yuzo Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting single flux quantum modulator circuit
Patent number
7,501,877
Issue date
Mar 10, 2009
Hitachi, Ltd.
Futoshi Furuta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Compensated NMR probe with high Q value for NMR apparatus
Patent number
7,471,087
Issue date
Dec 30, 2008
Hitachi, Ltd.
Yuzo Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Low temperature probe for NMR and NMR device
Patent number
7,358,736
Issue date
Apr 15, 2008
Hitachi, Ltd.
Yuzo Fukuda
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance probe coil
Patent number
7,352,186
Issue date
Apr 1, 2008
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance apparatus
Patent number
7,173,424
Issue date
Feb 6, 2007
Hitachi, Ltd.
Kazuo Saitoh
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance probe coil
Patent number
7,164,269
Issue date
Jan 16, 2007
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Grant
Nuclear magnetic resonance system
Patent number
7,141,975
Issue date
Nov 28, 2006
Hitachi, Ltd.
Hisaaki Ochi
G01 - MEASURING TESTING
Information
Patent Grant
NMR spectrometer and NMR probe
Patent number
7,138,801
Issue date
Nov 21, 2006
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Superconductor semiconductor integrated circuit
Patent number
7,129,869
Issue date
Oct 31, 2006
Hitachi, Ltd.
Futoshi Furuta
G11 - INFORMATION STORAGE
Information
Patent Grant
Nuclear magnetic resonance equipment
Patent number
6,958,608
Issue date
Oct 25, 2005
Hitachi, Ltd.
Kazumasa Takagi
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting single flux quantum circuit
Patent number
6,608,518
Issue date
Aug 19, 2003
Hitachi, Ltd.
Futoshi Furuta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Superconductor signal amplifier
Patent number
6,486,756
Issue date
Nov 26, 2002
Hitachi, Ltd.
Yoshinobu Tarutani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting device
Patent number
5,834,794
Issue date
Nov 10, 1998
Kabushiki Kaisha Toshiba
Hiroyuki Fuke
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Superconducting device
Patent number
5,550,389
Issue date
Aug 27, 1996
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting device including plural superconducting electrodes...
Patent number
5,442,195
Issue date
Aug 15, 1995
Hitachi, Ltd.
Kazuo Saitoh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
NUCLEAR MAGNETIC RESONANCE MEASUREMENT APPARATUS AND MEASURING METH...
Publication number
20090212776
Publication date
Aug 27, 2009
Hitachi, Ltd.
Isao Kitagawa
G01 - MEASURING TESTING
Information
Patent Application
PROBE FOR NMR MEASUREMENT
Publication number
20090121718
Publication date
May 14, 2009
Hiroyuki YAMAMOTO
G01 - MEASURING TESTING
Information
Patent Application
Apparatus of nuclear magnetic resonance measurement for continuous...
Publication number
20080290872
Publication date
Nov 27, 2008
Hitachi, Ltd.
Isao Kitagawa
G01 - MEASURING TESTING
Information
Patent Application
Leakage detection system
Publication number
20080262757
Publication date
Oct 23, 2008
Hitachi, Ltd.
Koichi Yokosawa
G01 - MEASURING TESTING
Information
Patent Application
Nuclear magnetic resonance spectrometer
Publication number
20080252294
Publication date
Oct 16, 2008
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
NMR spectrometer
Publication number
20080231277
Publication date
Sep 25, 2008
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Superconducting single flux quantum modulator circuit
Publication number
20080129368
Publication date
Jun 5, 2008
Hitachi, Ltd.
Futoshi Furuta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
NMR PROBE AND NMR SPECTROMETER
Publication number
20080111548
Publication date
May 15, 2008
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Probe for NMR Apparatus and NMR Apparatus Using the Same
Publication number
20080061786
Publication date
Mar 13, 2008
YUZO FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of superconducting magnesium diboride thin fil...
Publication number
20080064605
Publication date
Mar 13, 2008
Hitachi, Ltd.
Hiroyuki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Nuclear Magnetic resonance probe coil
Publication number
20070273379
Publication date
Nov 29, 2007
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
Magnetic immunoassay system
Publication number
20070254375
Publication date
Nov 1, 2007
Akira Tsukamoto
G01 - MEASURING TESTING
Information
Patent Application
Magnetic immunoassay system
Publication number
20070212794
Publication date
Sep 13, 2007
Hitachi, Ltd.
Akira Tsukamoto
G01 - MEASURING TESTING
Information
Patent Application
Low temperature probe for NMR and NMR device
Publication number
20070096740
Publication date
May 3, 2007
Yuzo Fukuda
G01 - MEASURING TESTING
Information
Patent Application
NMR probe for NMR apparatus
Publication number
20070096741
Publication date
May 3, 2007
Yuzo Fukuda
G01 - MEASURING TESTING
Information
Patent Application
Magnetic recording apparatus using magnetization reversal by spin i...
Publication number
20060268604
Publication date
Nov 30, 2006
Hitachi, Ltd.
Toshiyuki Onogi
G11 - INFORMATION STORAGE
Information
Patent Application
Nuclear magnetic resonance probe coil
Publication number
20060119359
Publication date
Jun 8, 2006
Hitachi, Ltd.
Haruhiro Hasegawa
G01 - MEASURING TESTING
Information
Patent Application
NMR spectrometer and NMR probe
Publication number
20060119360
Publication date
Jun 8, 2006
Hitachi, Ltd.
Hiroyuki Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Nuclear magnetic resonance system
Publication number
20060055407
Publication date
Mar 16, 2006
Hisaaki Ochi
G01 - MEASURING TESTING
Information
Patent Application
Nuclear magnetic resonance apparatus
Publication number
20060033498
Publication date
Feb 16, 2006
Kazuo Saitoh
G01 - MEASURING TESTING
Information
Patent Application
Immunoassay system and immunoassay method
Publication number
20050202572
Publication date
Sep 15, 2005
Hitachi, Ltd.
Yasuke Seki
G01 - MEASURING TESTING
Information
Patent Application
Superconductor semiconductor integrated circuit
Publication number
20050047245
Publication date
Mar 3, 2005
Hitachi, Ltd.
Futoshi Furuta
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Nuclear magnetic resonance equipment
Publication number
20040251902
Publication date
Dec 16, 2004
Kazumasa Takagi
G01 - MEASURING TESTING
Information
Patent Application
Superconducting single flux quantum circuit
Publication number
20030016069
Publication date
Jan 23, 2003
Hitachi, Ltd.
Futoshi Furuta
B82 - NANO-TECHNOLOGY
Information
Patent Application
Superconductor signal amplifier
Publication number
20010025012
Publication date
Sep 27, 2001
Yoshinobu Tarutani
H01 - BASIC ELECTRIC ELEMENTS