Kazuo Shii

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Asahimura, JP

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Patents Grantslast 30 patents

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Method of determining the position of electron beam irradiation and...
- Patent number 5,081,354
- Issue date Jan 14, 1992
- Hitachi, Ltd.
- Toshiyuki Ohhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 4,945,237
- Issue date Jul 31, 1990
- Hitachi, Ltd.
- Kazuo Shii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image distortion-free, image rotation-free electron microscope
- Patent number 4,494,000
- Issue date Jan 15, 1985
- Hitachi, Ltd.
- Kazuo Shii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,379,231
- Issue date Apr 5, 1983
- Hitachi, Ltd.
- Kazuo Shii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 4,283,627
- Issue date Aug 11, 1981
- Hitachi, Ltd.
- Shigeto Isakozawa
- H01 - BASIC ELECTRIC ELEMENTS