Kazuo Takahashi

Person

Ninomiya, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection apparatus and surface inspection method
- Patent number 9,036,141
- Issue date May 19, 2015
- Hitachi High-Technologies Corporation
- Terumi Obuchi
- G01 - MEASURING TESTING
Information Patent Grant
Surface shape measuring apparatus
- Patent number 8,958,076
- Issue date Feb 17, 2015
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 8,902,417
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Grant
Examination method and examination device
- Patent number 8,587,777
- Issue date Nov 19, 2013
- Hitachi High-Technologies Corporation
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,563,958
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,101,935
- Issue date Jan 24, 2012
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical defect inspection apparatus
- Patent number 7,894,052
- Issue date Feb 22, 2011
- Hitachi High-Technologies Corporation
- Noriyuki Aizawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection with variable digital filtering
- Patent number 7,791,721
- Issue date Sep 7, 2010
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical defect inspection apparatus
- Patent number 7,746,461
- Issue date Jun 29, 2010
- Hitachi High-Technologies Corporation
- Noriyuki Aizawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Measuring Apparatus
- Publication number 20130278926
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130271754
- Publication date Oct 17, 2013
- Hitachi High-Technologies Corporation
- Nobuaki Hirose
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130148113
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Mizuki Oku
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD
- Publication number 20130010290
- Publication date Jan 10, 2013
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD
- Publication number 20120327403
- Publication date Dec 27, 2012
- Hitachi High-Technologies Corporation
- Terumi OBUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120154797
- Publication date Jun 21, 2012
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
EXAMINATION METHOD AND EXAMINATION DEVICE
- Publication number 20110299088
- Publication date Dec 8, 2011
- Takahiro Jingu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION APPARATUS
- Publication number 20110102781
- Publication date May 5, 2011
- HITACHI HIGH-TECHNOLOGIES, CORP.
- Noriyuki AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION APPARATUS
- Publication number 20100231900
- Publication date Sep 16, 2010
- Hitachi High-Technologies Corporation
- Noriyuki AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION WITH VARIABLE DIGITAL FILTERING
- Publication number 20100225907
- Publication date Sep 9, 2010
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION APPARATUS
- Publication number 20100141936
- Publication date Jun 10, 2010
- HITACHI HIGH-TECHNOLOGIES, CORP.
- Noriyuki AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEFECT INSPECTION APPARATUS
- Publication number 20090147246
- Publication date Jun 11, 2009
- Hitachi High-Technologies Corporation
- Noriyuki AIZAWA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20090140180
- Publication date Jun 4, 2009
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus and surface inspection method
- Publication number 20080027665
- Publication date Jan 31, 2008
- Hitachi High-Technologies Corporation
- Kazuo Takahashi
- G01 - MEASURING TESTING
Information Patent Application
Optical defect inspection apparatus
- Publication number 20070211241
- Publication date Sep 13, 2007
- Noriyuki Aizawa
- G01 - MEASURING TESTING

Kazuo Takahashi

Person

Patents Grantslast 30 patents

Surface inspection apparatus and surface inspection method

Surface shape measuring apparatus

Inspection apparatus

Examination method and examination device

Inspection apparatus and inspection method

Inspection apparatus and inspection method

Optical defect inspection apparatus

Surface inspection with variable digital filtering

Optical defect inspection apparatus

Patents Applicationslast 30 patents

Measuring Apparatus

INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD

SURFACE INSPECTION APPARATUS AND SURFACE INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

EXAMINATION METHOD AND EXAMINATION DEVICE

OPTICAL DEFECT INSPECTION APPARATUS

OPTICAL DEFECT INSPECTION APPARATUS

SURFACE INSPECTION WITH VARIABLE DIGITAL FILTERING

OPTICAL DEFECT INSPECTION APPARATUS

OPTICAL DEFECT INSPECTION APPARATUS

INSPECTION APPARATUS AND INSPECTION METHOD

Surface inspection apparatus and surface inspection method

Optical defect inspection apparatus