Kazuo Takeda

Person

Higashimurayama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing an active matrix substrate and an image dis...
- Patent number 7,655,950
- Issue date Feb 2, 2010
- Hitachi Displays, Ltd.
- Takeshi Sato
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for measuring thickness of thin film, method for forming pol...
- Patent number 7,542,152
- Issue date Jun 2, 2009
- Hitachi Displays, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor thin film and process for production thereof
- Patent number 7,528,408
- Issue date May 5, 2009
- Hitachi, Ltd.
- Kazuo Takeda
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Process for producing polysilicon film
- Patent number 7,413,604
- Issue date Aug 19, 2008
- Hitachi, Ltd.
- Kazuo Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display device and method for manufacturing the same
- Patent number 7,232,716
- Issue date Jun 19, 2007
- Hitachi Displays, Ltd.
- Hironaru Yamaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor thin film decomposing method, decomposed semiconducto...
- Patent number 7,151,046
- Issue date Dec 19, 2006
- Hitachi Displays, Ltd.
- Kazuo Takeda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of manufacturing an active matrix substrate and an image dis...
- Patent number 7,022,558
- Issue date Apr 4, 2006
- Hitachi, Ltd.
- Takeshi Sato
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor thin film and process for production thereof
- Patent number 7,022,183
- Issue date Apr 4, 2006
- Hiatchi, Ltd.
- Kazuo Takeda
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Process for producing polycrystalline silicon film by crystallizing...
- Patent number 6,806,099
- Issue date Oct 19, 2004
- Hitachi, Ltd.
- Kazuo Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identification method for an article using crystal defects
- Patent number 6,760,472
- Issue date Jul 6, 2004
- Hitachi, Ltd.
- Kazuo Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and apparatus for silicon wafer
- Patent number 6,683,683
- Issue date Jan 27, 2004
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus for silicon wafer
- Patent number 6,384,909
- Issue date May 7, 2002
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus for silicon wafer
- Patent number 6,256,092
- Issue date Jul 3, 2001
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Defect assessing apparatus and method, and semiconductor manufactur...
- Patent number 6,226,079
- Issue date May 1, 2001
- Hitachi, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Particle handling apparatus for handling particles in fluid by acou...
- Patent number 6,216,538
- Issue date Apr 17, 2001
- Hitachi, Ltd.
- Kenji Yasuda
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Wafer inspecting apparatus
- Patent number 6,191,849
- Issue date Feb 20, 2001
- Hitachi, Ltd.
- Muneo Maeshima
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus for silicon wafer
- Patent number 6,157,444
- Issue date Dec 5, 2000
- Hitachi, Ltd.
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring crystal defect and equipment using the same
- Patent number 6,108,079
- Issue date Aug 22, 2000
- Hitachi, Ltd.
- Muneo Maeshima
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method, inspection apparatus and method of production of...
- Patent number 5,936,726
- Issue date Aug 10, 1999
- Hitachi Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Particle handling method by acoustic radiation force and apparatus...
- Patent number 5,902,489
- Issue date May 11, 1999
- Hitachi, Ltd.
- Kenji Yasuda
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Process for preparing protein-oriented membrane
- Patent number 5,252,719
- Issue date Oct 12, 1993
- Hitachi, Ltd.
- Kazuo Takeda
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Apparatus and method for monitoring body organs
- Patent number 5,190,039
- Issue date Mar 2, 1993
- Hitachi, Ltd.
- Hiroshi Takeuchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Apparatus for measuring characteristics of particles in fluid by de...
- Patent number 4,957,363
- Issue date Sep 18, 1990
- Hitachi, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring particles in liquid
- Patent number 4,876,458
- Issue date Oct 24, 1989
- Hitachi, Ltd.
- Kazuo Takeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Liquid crystal display apparatus
- Publication number 20070229737
- Publication date Oct 4, 2007
- Hitachi Displays, Ltd.
- Kazuo Takeda
- G02 - OPTICS
Information Patent Application
Method for measuring thickness of thin film, method for forming pol...
- Publication number 20060279744
- Publication date Dec 14, 2006
- Kazuo Takeda
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor thin film decomposing method, decomposed semiconducto...
- Publication number 20060254497
- Publication date Nov 16, 2006
- Hitachi Displays, Ltd.
- Kazuo Takeda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor thin film and process for production thereof
- Publication number 20060118036
- Publication date Jun 8, 2006
- Hitachi, Ltd.
- Kazuo Takeda
- C30 - CRYSTAL GROWTH
Information Patent Application
Method for manufacturing a polycrystalline semiconductor film, appa...
- Publication number 20050215077
- Publication date Sep 29, 2005
- Kazuo Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Display device and method for manufacturing the same
- Publication number 20050142701
- Publication date Jun 30, 2005
- Hitachi Displays, Ltd.
- Hironaru Yamaguchi
- G02 - OPTICS
Information Patent Application
Semiconductor thin film decomposing method, decomposed semiconducto...
- Publication number 20050139830
- Publication date Jun 30, 2005
- Kazuo Takeda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Process for producing polysilicon film
- Publication number 20050051081
- Publication date Mar 10, 2005
- Hitachi, Ltd.
- Kazuo Takeda
- C30 - CRYSTAL GROWTH
Information Patent Application
Information media using information of defect in an article
- Publication number 20050041836
- Publication date Feb 24, 2005
- Hitachi, Ltd.
- Kazuo Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of manufacturing an active matrix substrate and an image dis...
- Publication number 20040232432
- Publication date Nov 25, 2004
- Takeshi Sato
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Semiconductor thin film and process for production thereof
- Publication number 20040060504
- Publication date Apr 1, 2004
- Hitachi, Ltd.
- Kazuo Takeda
- C30 - CRYSTAL GROWTH
Information Patent Application
Process for producing polysilicon film
- Publication number 20030064571
- Publication date Apr 3, 2003
- Hitachi, Ltd.
- Kazuo Takeda
- C30 - CRYSTAL GROWTH
Information Patent Application
Defect inspection method and apparatus for silicon wafer
- Publication number 20020080344
- Publication date Jun 27, 2002
- Koji Tomita
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection method and apparatus for silicon wafer
- Publication number 20010015802
- Publication date Aug 23, 2001
- Koji Tomita
- G01 - MEASURING TESTING

Kazuo Takeda

Person

Patents Grantslast 30 patents

Method of manufacturing an active matrix substrate and an image dis...

Method for measuring thickness of thin film, method for forming pol...

Semiconductor thin film and process for production thereof

Process for producing polysilicon film

Display device and method for manufacturing the same

Semiconductor thin film decomposing method, decomposed semiconducto...

Method of manufacturing an active matrix substrate and an image dis...

Semiconductor thin film and process for production thereof

Process for producing polycrystalline silicon film by crystallizing...

Identification method for an article using crystal defects

Defect inspection method and apparatus for silicon wafer

Defect inspection method and apparatus for silicon wafer

Defect inspection apparatus for silicon wafer

Defect assessing apparatus and method, and semiconductor manufactur...

Particle handling apparatus for handling particles in fluid by acou...

Wafer inspecting apparatus

Defect inspection apparatus for silicon wafer

Method for measuring crystal defect and equipment using the same

Inspection method, inspection apparatus and method of production of...

Particle handling method by acoustic radiation force and apparatus...

Process for preparing protein-oriented membrane

Apparatus and method for monitoring body organs

Apparatus for measuring characteristics of particles in fluid by de...

Apparatus for measuring particles in liquid

Patents Applicationslast 30 patents

Liquid crystal display apparatus

Method for measuring thickness of thin film, method for forming pol...

Semiconductor thin film decomposing method, decomposed semiconducto...

Semiconductor thin film and process for production thereof

Method for manufacturing a polycrystalline semiconductor film, appa...

Display device and method for manufacturing the same

Semiconductor thin film decomposing method, decomposed semiconducto...

Process for producing polysilicon film

Information media using information of defect in an article

Method of manufacturing an active matrix substrate and an image dis...

Semiconductor thin film and process for production thereof

Process for producing polysilicon film

Defect inspection method and apparatus for silicon wafer

Defect inspection method and apparatus for silicon wafer