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Kazuo Tsuru
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Yokohama, JP
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last 30 patents
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Patent Grant
Semiconductor device with a high breakdown voltage
Patent number
5,031,021
Issue date
Jul 9, 1991
Kabushiki Kaisha Toshiba
Yoshiro Baba
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method of controlling lifetime of minority carriers by electron bea...
Patent number
4,585,489
Issue date
Apr 29, 1986
Kabushiki Kaisha Toshiba
Shun-ichi Hiraki
H01 - BASIC ELECTRIC ELEMENTS