Kazuo WATABE

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Adhesion/peeling method, and adhesion/peeling device
- Patent number 12,116,513
- Issue date Oct 15, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 12,104,986
- Issue date Oct 1, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 12,098,976
- Issue date Sep 24, 2024
- Kabushiki Kaisha Toshiba
- Yousuke Hisakuni
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection apparatus, and inspection method
- Patent number 12,038,349
- Issue date Jul 16, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method and measuring device
- Patent number 12,007,363
- Issue date Jun 11, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
State evaluation system, state evaluation apparatus, and state eval...
- Patent number 12,001,195
- Issue date Jun 4, 2024
- Kabushiki Kaisha Toshiba
- Yoshinori Mori
- G05 - CONTROLLING REGULATING
Information Patent Grant
Damaged region determination system, determination apparatus and da...
- Patent number 11,946,906
- Issue date Apr 2, 2024
- Kabushiki Kaisha Toshiba
- Toshiki Takayasu
- B61 - RAILWAYS
Information Patent Grant
Non-contact non-destructive inspection system, signal processing de...
- Patent number 11,879,815
- Issue date Jan 23, 2024
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation method and structure evaluation system
- Patent number 11,754,530
- Issue date Sep 12, 2023
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Object adhesion/peeling method, and object adhesion/peeling device
- Patent number 11,718,084
- Issue date Aug 8, 2023
- Kabushiki Kaisha Toshiba
- Takashi Usui
- B32 - LAYERED PRODUCTS
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 11,668,681
- Issue date Jun 6, 2023
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,639,880
- Issue date May 2, 2023
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Sensor including deformable part
- Patent number 11,513,102
- Issue date Nov 29, 2022
- University of Tokyo
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sensor module
- Patent number 11,474,081
- Issue date Oct 18, 2022
- Kabushiki Kaisha Toshiba
- Yongfang Li
- G01 - MEASURING TESTING
Information Patent Grant
Sensor including deformable parts
- Patent number 11,442,041
- Issue date Sep 13, 2022
- The University of Tokyo
- Isao Shimoyama
- G01 - MEASURING TESTING
Information Patent Grant
Sensor module
- Patent number 11,417,824
- Issue date Aug 16, 2022
- Kabushiki Kaisha Toshiba
- Yongfang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection device, detection system, detection method, and informati...
- Patent number 11,385,203
- Issue date Jul 12, 2022
- Kabushiki Kaisha Toshiba
- Keiichiro Someda
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive inspection method and nondestructive inspection system
- Patent number 11,371,875
- Issue date Jun 28, 2022
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- B61 - RAILWAYS
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 11,181,439
- Issue date Nov 23, 2021
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,073,498
- Issue date Jul 27, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, detection device, and detection method
- Patent number 11,041,830
- Issue date Jun 22, 2021
- Kabushiki Kaisha Toshiba
- Tomoya Fumikura
- G01 - MEASURING TESTING
Information Patent Grant
Detection system, detection method, and server device
- Patent number 11,002,711
- Issue date May 11, 2021
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, detection system, and detection method
- Patent number 10,955,383
- Issue date Mar 23, 2021
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system and structure evaluation method
- Patent number 10,883,919
- Issue date Jan 5, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation apparatus, structure evaluation system, and st...
- Patent number 10,794,990
- Issue date Oct 6, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Transfer apparatus and article taking-out method
- Patent number 10,793,378
- Issue date Oct 6, 2020
- Kabushiki Kaisha Toshiba
- Junya Tanaka
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Sensor adhesion state determination system, sensor adhesion state d...
- Patent number 10,712,318
- Issue date Jul 14, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,648,949
- Issue date May 12, 2020
- Kabushiki Kaisha Toshiba
- Kazuo Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Structure evaluation system, structure evaluation apparatus, and st...
- Patent number 10,613,060
- Issue date Apr 7, 2020
- Kabushiki Kaisha Toshiba
- Hidefumi Takamine
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis method, a deterioration diagnosis system, a...
- Patent number 10,578,587
- Issue date Mar 3, 2020
- Kabushiki Kaisha Toshiba
- Keiichiro Someda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20240319038
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, STRUCT...
- Publication number 20240094166
- Publication date Mar 21, 2024
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE, SENSOR MODULE INSTALLATION DEVICE, AND MOUNTING METH...
- Publication number 20230324345
- Publication date Oct 12, 2023
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR ATTACHMENT/DETACHMENT DEVICE, SENSOR ATTACHMENT/DETACHMENT S...
- Publication number 20230302542
- Publication date Sep 28, 2023
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ADHESION/PEELING METHOD, AND ADHESION/PEELING DEVICE
- Publication number 20230295474
- Publication date Sep 21, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20230280235
- Publication date Sep 7, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20230194382
- Publication date Jun 22, 2023
- Kabushiki Kaisha Toshiba
- Yousuke HISAKUNI
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER ARRAY
- Publication number 20230083674
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Yongfang LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20230083554
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
CORROSION DETERMINATION SYSTEM, CORROSION DETERMINATION APPARATUS A...
- Publication number 20230078350
- Publication date Mar 16, 2023
- Kabushiki Kaisha Toshiba
- Keisuke UENO
- G01 - MEASURING TESTING
Information Patent Application
DAMAGED REGION DETERMINATION SYSTEM, DETERMINATION APPARATUS AND DA...
- Publication number 20220334082
- Publication date Oct 20, 2022
- Kabushiki Kaisha Toshiba
- Toshiki TAKAYASU
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION APPARATUS, AND INSPECTION METHOD
- Publication number 20220299406
- Publication date Sep 22, 2022
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20220187253
- Publication date Jun 16, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT NON-DESTRUCTIVE INSPECTION SYSTEM, SIGNAL PROCESSING DE...
- Publication number 20220170813
- Publication date Jun 2, 2022
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING METHOD AND MEASURING DEVICE
- Publication number 20220146457
- Publication date May 12, 2022
- Kabushiki Kaisha Toshiba
- Takashi Usui
- G01 - MEASURING TESTING
Information Patent Application
VEHICLE INFORMATION ESTIMATION SYSTEM, VEHICLE INFORMATION ESTIMATI...
- Publication number 20220130240
- Publication date Apr 28, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION METHOD AND STRUCTURE EVALUATION SYSTEM
- Publication number 20220082528
- Publication date Mar 17, 2022
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD
- Publication number 20220034749
- Publication date Feb 3, 2022
- Kabushiki Kaisha Toshiba
- Tomoki Shiotani
- G01 - MEASURING TESTING
Information Patent Application
STATE EVALUATION SYSTEM, STATE EVALUATION APPARATUS, AND STATE EVAL...
- Publication number 20210397161
- Publication date Dec 23, 2021
- Kabushiki Kaisha Toshiba
- Yoshinori MORI
- G05 - CONTROLLING REGULATING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210396715
- Publication date Dec 23, 2021
- Kabushiki Kaisha Toshiba
- Yuki UEDA
- G01 - MEASURING TESTING
Information Patent Application
NONDESTRUCTIVE INSPECTION METHOD AND NONDESTRUCTIVE INSPECTION SYSTEM
- Publication number 20210181011
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Kazuo WATABE
- B61 - RAILWAYS
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD
- Publication number 20210181156
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...
- Publication number 20210181157
- Publication date Jun 17, 2021
- Kabushiki Kaisha Toshiba
- Hidefumi TAKAMINE
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20200408722
- Publication date Dec 31, 2020
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR
- Publication number 20200408721
- Publication date Dec 31, 2020
- THE UNIVERSITY OF TOKYO
- Isao SHIMOYAMA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE
- Publication number 20200292505
- Publication date Sep 17, 2020
- Kabushiki Kaisha Toshiba
- Yongfang Li
- G01 - MEASURING TESTING
Information Patent Application
SENSOR MODULE
- Publication number 20200295250
- Publication date Sep 17, 2020
- Kabushiki Kaisha Toshiba
- Yongfang LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION DEVICE, DETECTION SYSTEM, DETECTION METHOD, AND INFORMATI...
- Publication number 20200217822
- Publication date Jul 9, 2020
- Kabushiki Kaisha Toshiba
- Keiichiro SOMEDA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, DETECTION METHOD, AND SERVER DEVICE
- Publication number 20200080970
- Publication date Mar 12, 2020
- KABUSHIKI KAISHA TOSHIBA
- Takashi USUI
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD
- Publication number 20200018729
- Publication date Jan 16, 2020
- Kabushiki Kaisha Toshiba
- Tomoya FUMIKURA
- G01 - MEASURING TESTING

Kazuo WATABE

Person

Patents Grantslast 30 patents

Adhesion/peeling method, and adhesion/peeling device

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system and structure evaluation method

Inspection system, inspection apparatus, and inspection method

Measuring method and measuring device

State evaluation system, state evaluation apparatus, and state eval...

Damaged region determination system, determination apparatus and da...

Non-contact non-destructive inspection system, signal processing de...

Structure evaluation method and structure evaluation system

Object adhesion/peeling method, and object adhesion/peeling device

Detection device, detection system, and detection method

Structure evaluation system and structure evaluation method

Sensor including deformable part

Sensor module

Sensor including deformable parts

Sensor module

Detection device, detection system, detection method, and informati...

Nondestructive inspection method and nondestructive inspection system

Structure evaluation system and structure evaluation method

Detection system, detection device, and detection method

Detection system, detection device, and detection method

Detection system, detection method, and server device

Detection device, detection system, and detection method

Structure evaluation system and structure evaluation method

Structure evaluation apparatus, structure evaluation system, and st...

Transfer apparatus and article taking-out method

Sensor adhesion state determination system, sensor adhesion state d...

Structure evaluation system, structure evaluation apparatus, and st...

Structure evaluation system, structure evaluation apparatus, and st...

Deterioration diagnosis method, a deterioration diagnosis system, a...

Patents Applicationslast 30 patents

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, STRUCT...

SENSOR MODULE, SENSOR MODULE INSTALLATION DEVICE, AND MOUNTING METH...

SENSOR ATTACHMENT/DETACHMENT DEVICE, SENSOR ATTACHMENT/DETACHMENT S...

ADHESION/PEELING METHOD, AND ADHESION/PEELING DEVICE

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

CANTILEVER ARRAY

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

CORROSION DETERMINATION SYSTEM, CORROSION DETERMINATION APPARATUS A...

DAMAGED REGION DETERMINATION SYSTEM, DETERMINATION APPARATUS AND DA...

INSPECTION SYSTEM, INSPECTION APPARATUS, AND INSPECTION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

NON-CONTACT NON-DESTRUCTIVE INSPECTION SYSTEM, SIGNAL PROCESSING DE...

MEASURING METHOD AND MEASURING DEVICE

VEHICLE INFORMATION ESTIMATION SYSTEM, VEHICLE INFORMATION ESTIMATI...

STRUCTURE EVALUATION METHOD AND STRUCTURE EVALUATION SYSTEM

STRUCTURE EVALUATION SYSTEM AND STRUCTURE EVALUATION METHOD

STATE EVALUATION SYSTEM, STATE EVALUATION APPARATUS, AND STATE EVAL...

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

NONDESTRUCTIVE INSPECTION METHOD AND NONDESTRUCTIVE INSPECTION SYSTEM

DETECTION DEVICE, DETECTION SYSTEM, AND DETECTION METHOD

STRUCTURE EVALUATION SYSTEM, STRUCTURE EVALUATION APPARATUS, AND ST...

SENSOR

SENSOR

SENSOR MODULE

SENSOR MODULE

DETECTION DEVICE, DETECTION SYSTEM, DETECTION METHOD, AND INFORMATI...

DETECTION SYSTEM, DETECTION METHOD, AND SERVER DEVICE

DETECTION SYSTEM, DETECTION DEVICE, AND DETECTION METHOD