Kazuo YAMAGUCHI

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Compound, pattern forming substrate, coupling agent, and pattern fo...
- Patent number 11,767,327
- Issue date Sep 26, 2023
- Nikon Corporation
- Yusuke Kawakami
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Fluorine-containing compound, substrate for patterning, photodegrad...
- Patent number 11,518,731
- Issue date Dec 6, 2022
- Nikon Corporation
- Kazuo Yamaguchi
- C07 - ORGANIC CHEMISTRY
Information Patent Grant
Compound, substrate for pattern formation, photodegradable coupling...
- Patent number 11,225,461
- Issue date Jan 18, 2022
- Nikon Corporation
- Yusuke Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorine-containing composition, substrate for pattern formation, p...
- Patent number 10,466,591
- Issue date Nov 5, 2019
- Nikon Corporation
- Yusuke Kawakami
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Fluorine-containing compound, substrate for pattern formation, phot...
- Patent number 9,606,437
- Issue date Mar 28, 2017
- KANAGAWA UNIVERSITY
- Kazuo Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,107,717
- Issue date Jan 31, 2012
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,916,929
- Issue date Mar 29, 2011
- Hitachi, Ltd.
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,512,259
- Issue date Mar 31, 2009
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for observing and inspecting defects
- Patent number 7,499,162
- Issue date Mar 3, 2009
- Hitachi, Ltd.
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 7,274,813
- Issue date Sep 25, 2007
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for observing and inspecting defects
- Patent number 7,092,095
- Issue date Aug 15, 2006
- Hitachi, Ltd.
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 6,947,587
- Issue date Sep 20, 2005
- Hitachi, Ltd.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for observing and inspecting defects
- Patent number 6,690,469
- Issue date Feb 10, 2004
- Hitachi, Ltd.
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing optic transmission modules and system for...
- Patent number 6,661,503
- Issue date Dec 9, 2003
- Hitachi, Ltd.
- Kazuo Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for scraping off excessive portion of workpiece
- Patent number 5,331,770
- Issue date Jul 26, 1994
- Hitachi, Ltd.
- Masayuki Ichinohe
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Test pattern generator
- Patent number 4,862,460
- Issue date Aug 29, 1989
- Hitachi, Ltd.
- Kazuo Yamaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail memory equipment in memory tester
- Patent number 4,733,392
- Issue date Mar 22, 1988
- Hitachi, Ltd.
- Kazuo Yamaguchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Surface flaw detection method
- Patent number 4,647,196
- Issue date Mar 3, 1987
- Hitachi Metals, Ltd.
- Asahiro Kuni
- G01 - MEASURING TESTING
Information Patent Grant
Bit pattern generator
- Patent number 4,528,634
- Issue date Jul 9, 1985
- Hitachi, Ltd.
- Kozo Nakahata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Substrate bias generating circuit
- Patent number 4,471,290
- Issue date Sep 11, 1984
- Tokyo Shibaura Denki Kabushiki Kaisha
- Kazuo Yamaguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method of inspecting microscopic surface defects
- Patent number 4,449,818
- Issue date May 22, 1984
- Hitachi Metals, Ltd.
- Kazuo Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOTODEGRADABLE COUPLING...
- Publication number 20200233304
- Publication date Jul 23, 2020
- Nikon Corporation
- Yusuke KAWAKAMI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMPOUND, PATTERN FORMING SUBSTRATE, COUPLING AGENT, AND PATTERN FO...
- Publication number 20200148700
- Publication date May 14, 2020
- Nikon Corporation
- Yusuke KAWAKAMI
- C07 - ORGANIC CHEMISTRY
Information Patent Application
COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOTODEGRADABLE COUPLING...
- Publication number 20190352260
- Publication date Nov 21, 2019
- Nikon Corporation
- Yusuke KAWAKAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERNING, PHOTODEGRAD...
- Publication number 20190085004
- Publication date Mar 21, 2019
- KANAGAWA UNIVERSITY
- Kazuo YAMAGUCHI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FLUORINE-CONTAINING COMPOSITION, SUBSTRATE FOR PATTERN FORMATION, P...
- Publication number 20170285471
- Publication date Oct 5, 2017
- Nikon Corporation
- Yusuke KAWAKAMI
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOT...
- Publication number 20170158606
- Publication date Jun 8, 2017
- KANAGAWA UNIVERSITY
- Kazuo YAMAGUCHI
- C07 - ORGANIC CHEMISTRY
Information Patent Application
FLOURINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERNING, PHOTODEGRAD...
- Publication number 20160152642
- Publication date Jun 2, 2016
- KANAGAWA UNIVERSITY
- Kazuo YAMAGUCHI
- C07 - ORGANIC CHEMISTRY
Information Patent Application
FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHO...
- Publication number 20150168836
- Publication date Jun 18, 2015
- KANAGAWA UNIVERSITY
- Kazuo YAMAGUCHI
- C07 - ORGANIC CHEMISTRY
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20120128230
- Publication date May 24, 2012
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20110170765
- Publication date Jul 14, 2011
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20090214102
- Publication date Aug 27, 2009
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Observing and Inspecting Defects
- Publication number 20090141264
- Publication date Jun 4, 2009
- Hitachi, Ltd
- Yukihiro Shibata
- G02 - OPTICS
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20080101685
- Publication date May 1, 2008
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for observing and inspecting defects
- Publication number 20060238760
- Publication date Oct 26, 2006
- Hitachi, Ltd
- Yukihiro Shibata
- G02 - OPTICS
Information Patent Application
Method and apparatus for reviewing defects
- Publication number 20060210144
- Publication date Sep 21, 2006
- Kazuo Yamaguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspection method and apparatus
- Publication number 20060038987
- Publication date Feb 23, 2006
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for observing and inspecting defects
- Publication number 20040150821
- Publication date Aug 5, 2004
- Hitachi, Ltd
- Yukihiro Shibata
- G02 - OPTICS

Kazuo YAMAGUCHI

Person

Patents Grantslast 30 patents

Compound, pattern forming substrate, coupling agent, and pattern fo...

Fluorine-containing compound, substrate for patterning, photodegrad...

Compound, substrate for pattern formation, photodegradable coupling...

Fluorine-containing composition, substrate for pattern formation, p...

Fluorine-containing compound, substrate for pattern formation, phot...

Defect inspection method and apparatus

Defect inspection method and apparatus

Defect inspection method and apparatus

Method and apparatus for observing and inspecting defects

Defect inspection method and apparatus

Method and apparatus for observing and inspecting defects

Defect inspection method and apparatus

Method and apparatus for observing and inspecting defects

Method for manufacturing optic transmission modules and system for...

Method for scraping off excessive portion of workpiece

Test pattern generator

Fail memory equipment in memory tester

Surface flaw detection method

Bit pattern generator

Substrate bias generating circuit

Method of inspecting microscopic surface defects

Patents Applicationslast 30 patents

COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOTODEGRADABLE COUPLING...

COMPOUND, PATTERN FORMING SUBSTRATE, COUPLING AGENT, AND PATTERN FO...

COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOTODEGRADABLE COUPLING...

FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERNING, PHOTODEGRAD...

FLUORINE-CONTAINING COMPOSITION, SUBSTRATE FOR PATTERN FORMATION, P...

FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHOT...

FLOURINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERNING, PHOTODEGRAD...

FLUORINE-CONTAINING COMPOUND, SUBSTRATE FOR PATTERN FORMATION, PHO...

DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION METHOD AND APPARATUS

DEFECT INSPECTION METHOD AND APPARATUS

Method and Apparatus for Observing and Inspecting Defects

DEFECT INSPECTION METHOD AND APPARATUS

Method and apparatus for observing and inspecting defects

Method and apparatus for reviewing defects

Defect inspection method and apparatus

Method and apparatus for observing and inspecting defects