Kazushi Asami

Person

Okazaki-city, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method for the same
- Patent number 10,395,975
- Issue date Aug 27, 2019
- Denso Corporation
- Yuuki Inagaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device capable of restricting coil extension directio...
- Patent number 8,610,246
- Issue date Dec 17, 2013
- Denso Corporation
- Shinji Yoshihara
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 8,471,363
- Issue date Jun 25, 2013
- Denso Corporation
- Kazushi Asami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device manufacturing method
- Patent number 8,461,052
- Issue date Jun 11, 2013
- Denso Corporation
- Junji Oohara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Angular rate sensor
- Patent number 8,256,289
- Issue date Sep 4, 2012
- Denso Corporation
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Angular rate sensor
- Patent number 7,900,512
- Issue date Mar 8, 2011
- Denso Corporation
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Grant
Acceleration sensor and method for manufacturing the same
- Patent number 7,418,864
- Issue date Sep 2, 2008
- Denso Corporation
- Kazushi Asami
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for manufacturing movable portion of semiconductor device
- Patent number 7,214,625
- Issue date May 8, 2007
- Denso Corporation
- Kazushi Asami
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Optical device having movable portion and method for manufacturing...
- Patent number 7,105,902
- Issue date Sep 12, 2006
- Denso Corporation
- Kazushi Asami
- G02 - OPTICS
Information Patent Grant
Semiconductor dynamic quantity detecting sensor and manufacturing m...
- Patent number 6,718,824
- Issue date Apr 13, 2004
- Nippon Soken, Inc.
- Takeshi Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitance type humidity sensor and manufacturing method of the same
- Patent number 6,580,600
- Issue date Jun 17, 2003
- Nippon Soken, Inc.
- Inao Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Pair of electrodes for detecting acidity or basicity of oil
- Patent number 6,549,015
- Issue date Apr 15, 2003
- Denso Corporation
- Kazuyuki Horie
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
- Patent number 6,287,885
- Issue date Sep 11, 2001
- Denso Corporation
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Angular velocity sensor
- Patent number 6,119,518
- Issue date Sep 19, 2000
- Nippon Soken, Inc.
- Takeshi Itou
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity sensor
- Patent number 6,116,087
- Issue date Sep 12, 2000
- Nippon Soken, Inc.
- Kazushi Asami
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor devices by use of dry etching
- Patent number 6,010,919
- Issue date Jan 4, 2000
- Nippon Soken, Inc.
- Yasushi Matsuhiro
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Plasma etching method and device manufacturing method thereby
- Patent number 5,575,887
- Issue date Nov 19, 1996
- Nippondenso Co., Ltd.
- Takahiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process of plasma etching silicon
- Patent number 5,536,364
- Issue date Jul 16, 1996
- Nippon Soken, Inc.
- Takahiko Yoshida
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME
- Publication number 20150270339
- Publication date Sep 24, 2015
- DENSO CORPORATION
- Yuuki INAGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120080772
- Publication date Apr 5, 2012
- DENSO CORPORATION
- Kazushi Asami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20110248380
- Publication date Oct 13, 2011
- DENSO CORPORATION
- Shinji YOSHIHARA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SEMICONDUCTOR DEVICE MANUFACTURING METHOD
- Publication number 20110244687
- Publication date Oct 6, 2011
- DENSO CORPORATION
- Junji OOHARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEPOSITION METHOD, DEPOSITION APPARATUS, AND LAMINATED FILM
- Publication number 20110129686
- Publication date Jun 2, 2011
- DENSO CORPORATION
- Hideo YAMADA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Angular rate sensor
- Publication number 20110041605
- Publication date Feb 24, 2011
- DENSO CORPORATION
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Application
Angular rate sensor
- Publication number 20110041604
- Publication date Feb 24, 2011
- DENSO CORPORATION
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Application
Angular rate sensor
- Publication number 20080028855
- Publication date Feb 7, 2008
- DENSO CORPORATION
- Kazuhiko Kano
- G01 - MEASURING TESTING
Information Patent Application
Acceleration sensor and method for manufacturing the same
- Publication number 20060213268
- Publication date Sep 28, 2006
- DENSO CORPORATION
- Kazushi Asami
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method for manufacturing movable portion of semiconductor device
- Publication number 20050054153
- Publication date Mar 10, 2005
- DENSO Corporation
- Kazushi Asami
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Optical device having movable portion and method for manufacturing...
- Publication number 20040155243
- Publication date Aug 12, 2004
- DENSO Corporation
- Kazushi Asami
- G02 - OPTICS
Information Patent Application
Capacitance type humidity sensor and manufacturing method of the same
- Publication number 20020141136
- Publication date Oct 3, 2002
- Indo Toyoda
- G01 - MEASURING TESTING
Information Patent Application
Capacitance type humidity sensor and manufacturing method of the same
- Publication number 20020114125
- Publication date Aug 22, 2002
- Inao Toyoda
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor dynamic quantity detecting sensor and manufacturing m...
- Publication number 20020073779
- Publication date Jun 20, 2002
- Takeshi Ito
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Pair of electrodes for detecting acidity or basicity of oil
- Publication number 20010005137
- Publication date Jun 28, 2001
- Kazuyuki Horie
- G01 - MEASURING TESTING

Kazushi Asami

Person

Patents Grantslast 30 patents

Semiconductor device and manufacturing method for the same

Semiconductor device capable of restricting coil extension directio...

Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing method

Angular rate sensor

Angular rate sensor

Acceleration sensor and method for manufacturing the same

Method for manufacturing movable portion of semiconductor device

Optical device having movable portion and method for manufacturing...

Semiconductor dynamic quantity detecting sensor and manufacturing m...

Capacitance type humidity sensor and manufacturing method of the same

Pair of electrodes for detecting acidity or basicity of oil

Method for manufacturing semiconductor dynamic quantity sensor

Angular velocity sensor

Angular velocity sensor

Method for manufacturing semiconductor devices by use of dry etching

Plasma etching method and device manufacturing method thereby

Process of plasma etching silicon

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE MANUFACTURING METHOD

DEPOSITION METHOD, DEPOSITION APPARATUS, AND LAMINATED FILM

Angular rate sensor

Angular rate sensor

Angular rate sensor

Acceleration sensor and method for manufacturing the same

Method for manufacturing movable portion of semiconductor device

Optical device having movable portion and method for manufacturing...

Capacitance type humidity sensor and manufacturing method of the same

Capacitance type humidity sensor and manufacturing method of the same

Semiconductor dynamic quantity detecting sensor and manufacturing m...

Pair of electrodes for detecting acidity or basicity of oil