Kazushi Hayashi

Person

Kobe, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for evaluating quality of oxide semiconductor thin film, met...
- Patent number 10,475,711
- Issue date Nov 12, 2019
- Kobe Steel, Ltd.
- Kazushi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluation method for oxide semiconductor thin film, quality contro...
- Patent number 10,090,208
- Issue date Oct 2, 2018
- Kobe Steel, Ltd.
- Tomoya Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating oxide semiconductor thin film, method for man...
- Patent number 9,816,944
- Issue date Nov 14, 2017
- Kobe Steel, Ltd.
- Kazushi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating quality of oxide semiconductor thin film and...
- Patent number 9,780,005
- Issue date Oct 3, 2017
- Kobe Steel, Ltd.
- Nobuyuki Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Oxide for semiconductor layer of thin film transistor, thin film tr...
- Patent number 9,583,633
- Issue date Feb 28, 2017
- Samsung Display Co., Ltd.
- Byung Du Ahn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating oxide semiconductor thin film, and method for...
- Patent number 9,316,589
- Issue date Apr 19, 2016
- Kobe Steel, Ltd.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring semiconductor carrier lifetime
- Patent number 9,279,762
- Issue date Mar 8, 2016
- Kobe Steel, Ltd.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for forming thin film
- Patent number 7,897,025
- Issue date Mar 1, 2011
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Surface-treatment method and equipment
- Patent number 7,459,187
- Issue date Dec 2, 2008
- Kabushiki Kaisha Kobe Seiko Sho.
- Kazushi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Highly-oriented diamond film, method for manufacturing the same, an...
- Patent number 7,311,977
- Issue date Dec 25, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Yoshihiro Yokota
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Semiconductor device and method for manufacturing multilayered subs...
- Patent number 7,285,479
- Issue date Oct 23, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Takeshi Tachibana
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ultraviolet sensor and method for manufacturing the same
- Patent number 7,193,241
- Issue date Mar 20, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Heat spreader and semiconductor device and package using the same
- Patent number 7,067,903
- Issue date Jun 27, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Takeshi Tachibana
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diamond semiconductor device and method for manufacturing the same
- Patent number 7,064,352
- Issue date Jun 20, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Yoshihiro Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming diamond film
- Patent number 6,383,288
- Issue date May 7, 2002
- Kabushiki Kaisha Kobe Seiko Sho
- Kazushi Hayashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Organic light emitting device using diamond film
- Patent number 6,198,218
- Issue date Mar 6, 2001
- Kabushiki Kaisha Kobe Seiko Sho
- Koji Kobashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Highly-oriented diamond film heat dissipating substrate
- Patent number 5,529,846
- Issue date Jun 25, 1996
- Kobe Steel U.S.A., Inc.
- Kazushi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Formation of highly oriented diamond film
- Patent number 5,479,875
- Issue date Jan 2, 1996
- Kabushiki Kaisha Kobe Seiko Sho
- Takeshi Tachibana
- C30 - CRYSTAL GROWTH
Information Patent Grant
Heat-resisting ohmic contact on semiconductor diamond layer
- Patent number 5,436,505
- Issue date Jul 25, 1995
- Kabushiki Kaisha Kobe Seiko Sho
- Kazushi Hayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic sensor element using highly-oriented diamond film and magn...
- Patent number 5,424,561
- Issue date Jun 13, 1995
- Kobe Steel USA Inc.
- Takeshi Tachibana
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...
- Publication number 20250164422
- Publication date May 22, 2025
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Koji SASAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING QUALITY OF OXIDE SEMICONDUCTOR THIN FILM, MET...
- Publication number 20190122941
- Publication date Apr 25, 2019
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
NEGATIVE ELECTRODE FOR IRON-AIR SECONDARY BATTERY, IRON-AIR SECONDA...
- Publication number 20180219220
- Publication date Aug 2, 2018
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUALITY EVALUATION METHOD FOR LAMINATE HAVING PROTECTIVE LAYER ON S...
- Publication number 20170184660
- Publication date Jun 29, 2017
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR EVALUATING OXIDE SEMICONDUCTOR THIN FILM, METHOD FOR MAN...
- Publication number 20160282284
- Publication date Sep 29, 2016
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
EVALUATION DEVICE FOR OXIDE SEMICONDUCTOR THIN FILM
- Publication number 20160223462
- Publication date Aug 4, 2016
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...
- Publication number 20160211384
- Publication date Jul 21, 2016
- SAMSUNG DISPLAY CO., LTD.
- BYUNG DU AHN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, QUALITY CONTRO...
- Publication number 20150371906
- Publication date Dec 24, 2015
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Tomoya KISHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...
- Publication number 20150364553
- Publication date Dec 17, 2015
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Shuji KOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...
- Publication number 20150357474
- Publication date Dec 10, 2015
- KABUSHIKI KAISHA KOBE SEIKO SHO(KOBE STEEL, LTD)
- Shuji KOSAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR EVALUATING OXIDE SEMICONDUCTOR THIN FILM, AND METHOD FOR...
- Publication number 20150355095
- Publication date Dec 10, 2015
- Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Kazushi HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME
- Publication number 20120203473
- Publication date Aug 9, 2012
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazushi Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Beam Detector and Beam Monitor Using The Same
- Publication number 20100219350
- Publication date Sep 2, 2010
- Koji Kobashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR FORMING THIN FILM
- Publication number 20090098311
- Publication date Apr 16, 2009
- Asahi Glass Company, Limited
- Nobutaka AOMINE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Surface-treatment method and equipment
- Publication number 20070134414
- Publication date Jun 14, 2007
- Kazushi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Copper base for electronic component, electronic component, and pro...
- Publication number 20070039666
- Publication date Feb 22, 2007
- Kabushiki Kaisha Kobe Seiko Sho.
- Kazushi Hayashi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Semiconductor device and method for manufacturing multilayered subs...
- Publication number 20060175293
- Publication date Aug 10, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Takeshi Tachibana
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Highly-oriented diamond film, method for manufacturing the same, an...
- Publication number 20060112874
- Publication date Jun 1, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Yoshihiro Yokota
- C30 - CRYSTAL GROWTH
Information Patent Application
Diamond sensor
- Publication number 20060001029
- Publication date Jan 5, 2006
- Kabushiki Kaisha Kobe Seiko Sho.
- Kazushi Hayashi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Ultraviolet sensor and method for manufacturing the same
- Publication number 20050181122
- Publication date Aug 18, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Kazushi Hayashi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Method and apparatus for forming thin film
- Publication number 20050136694
- Publication date Jun 23, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Kenichi Inoue
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Diamond semiconductor device and method for manufacturing the same
- Publication number 20050127373
- Publication date Jun 16, 2005
- Kabushiki Kaisha Kobe Seiko Sho.
- Yoshihiro Yokota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Heat spreader and semiconductor device and package using the same
- Publication number 20040238946
- Publication date Dec 2, 2004
- Kabushik Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
- Takeshi Tachibana
- H01 - BASIC ELECTRIC ELEMENTS

Kazushi Hayashi

Person

Patents Grantslast 30 patents

Method for evaluating quality of oxide semiconductor thin film, met...

Evaluation method for oxide semiconductor thin film, quality contro...

Method for evaluating oxide semiconductor thin film, method for man...

Method for evaluating quality of oxide semiconductor thin film and...

Oxide for semiconductor layer of thin film transistor, thin film tr...

Method for evaluating oxide semiconductor thin film, and method for...

Apparatus and method for measuring semiconductor carrier lifetime

Method and apparatus for forming thin film

Surface-treatment method and equipment

Highly-oriented diamond film, method for manufacturing the same, an...

Semiconductor device and method for manufacturing multilayered subs...

Ultraviolet sensor and method for manufacturing the same

Heat spreader and semiconductor device and package using the same

Diamond semiconductor device and method for manufacturing the same

Method of forming diamond film

Organic light emitting device using diamond film

Highly-oriented diamond film heat dissipating substrate

Formation of highly oriented diamond film

Heat-resisting ohmic contact on semiconductor diamond layer

Magnetic sensor element using highly-oriented diamond film and magn...

Patents Applicationslast 30 patents

METHOD FOR CALCULATING FILM THICKNESS OF GRAIN BOUNDARY OXIDE LAYER...

METHOD FOR EVALUATING QUALITY OF OXIDE SEMICONDUCTOR THIN FILM, MET...

NEGATIVE ELECTRODE FOR IRON-AIR SECONDARY BATTERY, IRON-AIR SECONDA...

QUALITY EVALUATION METHOD FOR LAMINATE HAVING PROTECTIVE LAYER ON S...

METHOD FOR EVALUATING OXIDE SEMICONDUCTOR THIN FILM, METHOD FOR MAN...

EVALUATION DEVICE FOR OXIDE SEMICONDUCTOR THIN FILM

OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...

EVALUATION METHOD FOR OXIDE SEMICONDUCTOR THIN FILM, QUALITY CONTRO...

OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...

OXIDE FOR SEMICONDUCTOR LAYER OF THIN FILM TRANSISTOR, THIN FILM TR...

METHOD FOR EVALUATING OXIDE SEMICONDUCTOR THIN FILM, AND METHOD FOR...

APPARATUS AND METHOD FOR MEASURING SEMICONDUCTOR CARRIER LIFETIME

Beam Detector and Beam Monitor Using The Same

METHOD FOR FORMING THIN FILM

Surface-treatment method and equipment

Copper base for electronic component, electronic component, and pro...

Semiconductor device and method for manufacturing multilayered subs...

Highly-oriented diamond film, method for manufacturing the same, an...

Diamond sensor

Ultraviolet sensor and method for manufacturing the same

Method and apparatus for forming thin film

Diamond semiconductor device and method for manufacturing the same

Heat spreader and semiconductor device and package using the same