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Kazushi Ishida
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method of removing particles from stage and cleaning plate
Patent number
6,565,419
Issue date
May 20, 2003
Advantest Corporation
Naoki Nishio
B08 - CLEANING
Information
Patent Grant
Method and system for charged particle beam exposure
Patent number
6,046,459
Issue date
Apr 4, 2000
Fujitsu Limited
Nobuyuki Yasutake
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method for charged particle beam exposure with fixed barycenter thr...
Patent number
5,981,118
Issue date
Nov 9, 1999
Fujitsu Ltd.
Nobuyuki Yasutake
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Charged particle beam exposure apparatus
Patent number
5,966,200
Issue date
Oct 12, 1999
Fujuitsu Limited
Kenichi Kawakami
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Charged particle beam exposure method and apparatus
Patent number
5,895,924
Issue date
Apr 20, 1999
Fujitsu Limited
Hiroshi Yasuda
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Electron-beam exposure device and a method of detecting a mark posi...
Patent number
5,708,276
Issue date
Jan 13, 1998
Fujitsu Limited
Tatsuro Ohkawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
X-Y stage and charged particle beam exposure apparatus
Patent number
5,561,299
Issue date
Oct 1, 1996
Fujitsu Limited
Kazushi Ishida
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Push button switch using dome spring and switch element thereof
Patent number
4,803,316
Issue date
Feb 7, 1989
Fujitsu Limited
Kazutoshi Hayashi
H01 - BASIC ELECTRIC ELEMENTS