Kazushi Yoshimura

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Internal defect inspection method and apparatus for the same
- Patent number 9,134,279
- Issue date Sep 15, 2015
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for repairing circuit pattern and method for manufacturin...
- Patent number 8,035,058
- Issue date Oct 11, 2011
- Hitachi Displays, Ltd.
- Nobuaki Nakasu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,952,074
- Issue date May 31, 2011
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,417,444
- Issue date Aug 26, 2008
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 7,026,830
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for circuit patterns and a method thereof
- Patent number 6,831,998
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Hiroya Koshishiba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,559,663
- Issue date May 6, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,329,826
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting integrated circuit pattern
- Patent number 6,172,363
- Issue date Jan 9, 2001
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection and correction of wiring of ele...
- Patent number 5,883,437
- Issue date Mar 16, 1999
- Hitachi, Ltd.
- Shigenobu Maruyama
- G02 - OPTICS
Information Patent Grant
Method and apparatus for detecting photoacoustic signal to detect s...
- Patent number 5,781,294
- Issue date Jul 14, 1998
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method for pattern inspection and apparatus therefor
- Patent number 5,301,248
- Issue date Apr 5, 1994
- Hitachi, Ltd.
- Ninomiya Takanori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting soldered portions
- Patent number 4,772,125
- Issue date Sep 20, 1988
- Hitachi, Ltd.
- Kazushi Yoshimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting edge of fine pattern on specimen
- Patent number 4,556,797
- Issue date Dec 3, 1985
- Hitachi, Ltd.
- Asahiro Kuni
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME
- Publication number 20130160552
- Publication date Jun 27, 2013
- Hitachi, Ltd
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN
- Publication number 20080302964
- Publication date Dec 11, 2008
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Laser processing machine and laser processing method
- Publication number 20060102608
- Publication date May 18, 2006
- Daisuke Katsuta
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus for repairing circuit pattern and method for manufacturin...
- Publication number 20060065645
- Publication date Mar 30, 2006
- Nobuaki Nakasu
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20060043982
- Publication date Mar 2, 2006
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20030169060
- Publication date Sep 11, 2003
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting integrated circuit pattern
- Publication number 20020027440
- Publication date Mar 7, 2002
- Hitachi, Ltd.
- Hiroyuki Shinada
- G01 - MEASURING TESTING

Kazushi Yoshimura

Person

Patents Grantslast 30 patents

Internal defect inspection method and apparatus for the same

Apparatus for repairing circuit pattern and method for manufacturin...

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Inspection system for circuit patterns and a method thereof

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspection and correction of wiring of ele...

Method and apparatus for detecting photoacoustic signal to detect s...

Method for pattern inspection and apparatus therefor

Apparatus and method for inspecting soldered portions

Method and apparatus for detecting edge of fine pattern on specimen

Patents Applicationslast 30 patents

INTERNAL DEFECT INSPECTION METHOD AND APPARATUS FOR THE SAME

METHOD AND APPARATUS FOR INSPECTING INTEGRATED CIRCUIT PATTERN

Laser processing machine and laser processing method

Apparatus for repairing circuit pattern and method for manufacturin...

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern

Method and apparatus for inspecting integrated circuit pattern