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Kazushige KOSHIKAWA
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Hamamatsu-shi, Shizuoka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Device analysis apparatus and device analysis method
Patent number
11,460,497
Issue date
Oct 4, 2022
Hamamatsu Photonics K.K.
Toru Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting semiconductor device
Patent number
11,156,565
Issue date
Oct 26, 2021
Hamamatsu Photonics K.K.
Toru Matsumoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting semiconductor device
Patent number
11,125,698
Issue date
Sep 21, 2021
Hamamatsu Photonics K.K.
Toru Matsumoto
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR INSPECTING SEMICONDUCTOR DEVICE
Publication number
20200386693
Publication date
Dec 10, 2020
Hamamatsu Photonics K.K.
Toru MATSUMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEVICE ANALYSIS APPARATUS AND DEVICE ANALYSIS METHOD
Publication number
20200110127
Publication date
Apr 9, 2020
Hamamatsu Photonics K.K.
Toru MATSUMOTO
G01 - MEASURING TESTING