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Kazushige NISHIMURA

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Patents Grantslast 30 patents

  • Information Patent Grant

    Analysis device provided with ion mobility separation part
    • Patent number 10,684,256
    • Issue date Jun 16, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Hiroyuki Satake
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ion analysis device
    • Patent number 10,551,346
    • Issue date Feb 4, 2020
    • Hitachi High-Technologies Corporation
    • Kazushige Nishimura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Ionization device
    • Patent number 10,466,214
    • Issue date Nov 5, 2019
    • Hitachi, Ltd.
    • Masako Ishimaru
    • G02 - OPTICS
  • Information Patent Grant

    Ion analysis device
    • Patent number 10,431,445
    • Issue date Oct 1, 2019
    • Hitachi High-Technologies Corporation
    • Kazushige Nishimura
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer and method
    • Patent number 9,601,321
    • Issue date Mar 21, 2017
    • Hitachi High-Technologies Corporation
    • Akihito Kaneko
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer and mass analyzing method for efficiently ionizin...
    • Patent number 9,543,135
    • Issue date Jan 10, 2017
    • Hitachi High-Technologies Corporation
    • Shun Kumano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometric system
    • Patent number 9,287,105
    • Issue date Mar 15, 2016
    • Hitachi High-Technologies Corporation
    • Yohei Kawaguchi
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass spectrometer and mass spectrometry
    • Patent number 8,803,084
    • Issue date Aug 12, 2014
    • Hitachi High-Technologies Corporation
    • Kazushige Nishimura
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

  • Information Patent Application

    Ion Analysis Device
    • Publication number 20190178841
    • Publication date Jun 13, 2019
    • Hitachi High-Technologies Corporation
    • Kazushige NISHIMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Analysis Device Provided with Ion Mobility Separation Part
    • Publication number 20190079051
    • Publication date Mar 14, 2019
    • Hitachi High-Technologies Corporation
    • Hiroyuki SATAKE
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    IONIZATION DEVICE
    • Publication number 20180284083
    • Publication date Oct 4, 2018
    • Hitachi, Ltd
    • Masako ISHIMARU
    • G01 - MEASURING TESTING
  • Information Patent Application

    ION ANALYSIS DEVICE
    • Publication number 20180286658
    • Publication date Oct 4, 2018
    • Hitachi High-Technologies Corporation
    • Kazushige NISHIMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometer and Method
    • Publication number 20150206728
    • Publication date Jul 23, 2015
    • Hitachi High-Technologies Corporation
    • Akihito Kaneko
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Mass Spectrometric System
    • Publication number 20130228677
    • Publication date Sep 5, 2013
    • Hitachi High-Technologies Corporation
    • Yohei KAWAGUCHI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER AND MASS SPECTROMETRY
    • Publication number 20130161507
    • Publication date Jun 27, 2013
    • Hitachi High-Technologies Corporation
    • Kazushige NISHIMURA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER AND MASS ANALYZING METHOD
    • Publication number 20130048851
    • Publication date Feb 28, 2013
    • Hitachi High-Technologies Corporation
    • Shun KUMANO
    • H01 - BASIC ELECTRIC ELEMENTS