Kazutaka ERIGUCHI

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating manufacturing process of silicon material and...
- Patent number 10,676,840
- Issue date Jun 9, 2020
- Sumco Corporation
- Noritomo Mitsugi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating semiconductor substrate and method of manufact...
- Patent number 10,641,708
- Issue date May 5, 2020
- Sumco Corporation
- Kazutaka Eriguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating metal contamination in semiconductor wafer and...
- Patent number 9,842,779
- Issue date Dec 12, 2017
- Sumco Corporation
- Kei Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING MANUFACTURING PROCESS OF SILICON MATERIAL AND...
- Publication number 20180179661
- Publication date Jun 28, 2018
- SUMCO CORPORATION
- Noritomo MITSUGI
- C30 - CRYSTAL GROWTH
Information Patent Application
METHOD OF EVALUATING SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACT...
- Publication number 20180038797
- Publication date Feb 8, 2018
- SUMCO CORPORATION
- Kazutaka ERIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR WAFER AND...
- Publication number 20150318222
- Publication date Nov 5, 2015
- SUMCO CORPORATION
- Kei MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS