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Nagoya, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Anti-contamination trap, and vacuum application device
Patent number
10,269,533
Issue date
Apr 23, 2019
Hitachi High-Technologies Corporation
Takashi Mizuo
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Grant
Method of forming a sample image and charged particle beam apparatus
Patent number
7,800,059
Issue date
Sep 21, 2010
Hitachi High-Technologies Corporation
Mitsugu Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming a sample image and charged particle beam apparatus
Patent number
7,361,894
Issue date
Apr 22, 2008
Hitachi High-Technologies Corporation
Mitsugu Sato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of forming a sample image and charged particle beam apparatus
Patent number
7,164,126
Issue date
Jan 16, 2007
Hitachi High-Technologies Corporation
Mitsugu Sato
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming a sample image and charged particle beam apparatus
Patent number
7,034,296
Issue date
Apr 25, 2006
Hitachi High-Technologies Corporation
Mitsugu Sato
G01 - MEASURING TESTING
Information
Patent Grant
Scanning electron microscope and sample observing method using it
Patent number
6,963,067
Issue date
Nov 8, 2005
Hitachi High-Technologies Corporation
Shuichi Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Anti-Contamination Trap, and Vacuum Application Device
Publication number
20160203940
Publication date
Jul 14, 2016
Hitachi High-Technologies Corporation
Takashi MIZUO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming a sample image and charged particle beam apparatus
Publication number
20080217535
Publication date
Sep 11, 2008
Mitsugu Sato
G01 - MEASURING TESTING
Information
Patent Application
Method of forming a sample image and charged particle beam apparatus
Publication number
20070029478
Publication date
Feb 8, 2007
Mitsugu Sato
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scanning electron microscope and sample observing method using it
Publication number
20040188611
Publication date
Sep 30, 2004
Shuichi Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming a sample image and charged particle beam apparatus
Publication number
20030141451
Publication date
Jul 31, 2003
Mitsugu Sato
G01 - MEASURING TESTING
Information
Patent Application
Method of forming a sample image and charged particle beam apparatus
Publication number
20030111602
Publication date
Jun 19, 2003
Mitsugu Sato
G01 - MEASURING TESTING