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Kazutoshi INOUE
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Oscillation circuit, integrated circuit, and abnormality detection...
Patent number
9,453,881
Issue date
Sep 27, 2016
Lapis Semiconductor Co., Ltd.
Katsutoshi Yoshimura
G01 - MEASURING TESTING
Information
Patent Grant
Electrical device and method of setting address
Patent number
9,128,831
Issue date
Sep 8, 2015
Lapis Semiconductor Co., Ltd.
Kazutoshi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor circuit, semiconductor device, method of diagnosing a...
Patent number
8,836,341
Issue date
Sep 16, 2014
Lapis Semiconductor Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Signal processor and signal processing system
Patent number
8,412,902
Issue date
Apr 2, 2013
Oki Semiconductor Co., Ltd.
Kazutoshi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for unloading thermally treated non-planar silicon wafers wi...
Patent number
7,820,554
Issue date
Oct 26, 2010
Sumco Corporation
Kazutoshi Inoue
C30 - CRYSTAL GROWTH
Information
Patent Grant
Semiconductor device to improve data retention characteristics of DRAM
Patent number
7,315,970
Issue date
Jan 1, 2008
Sony Corporation
Tomofumi Arakawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit
Patent number
7,230,861
Issue date
Jun 12, 2007
Sony Corporation
Kazutoshi Inoue
G11 - INFORMATION STORAGE
Information
Patent Grant
Microcontroller with multiple function blocks and clock signal control
Patent number
7,058,842
Issue date
Jun 6, 2006
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test circuit and multi-chip package type semiconductor device havin...
Patent number
6,967,397
Issue date
Nov 22, 2005
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and multi-chip package type semiconductor device havin...
Patent number
6,897,554
Issue date
May 24, 2005
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and multi-chip package type semiconductor device havin...
Patent number
6,885,094
Issue date
Apr 26, 2005
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and multi-chip package type semiconductor device havin...
Patent number
6,885,095
Issue date
Apr 26, 2005
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit and multi-chip package type semiconductor device havin...
Patent number
6,762,486
Issue date
Jul 13, 2004
Oki Electric Industry Co., Ltd.
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Clock control circuit
Patent number
6,229,369
Issue date
May 8, 2001
Oki Electric Industry Co., Ltd.
Atsushi Yusa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit having independently testable input-output circu...
Patent number
5,936,448
Issue date
Aug 10, 1999
Oki Electric Industry Co., Ltd.
Mitsuya Ohie
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRICAL DEVICE AND METHOD OF SETTING ADDRESS
Publication number
20140068108
Publication date
Mar 6, 2014
LAPIS SEMICONDUCTOR CO., LTD.
Kazutoshi INOUE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OSCILLATION CIRCUIT, INTEGRATED CIRCUIT, AND ABNORMALITY DETECTION...
Publication number
20130222068
Publication date
Aug 29, 2013
LAPIS Semiconductor Co., Ltd.
Katsutoshi YOSHIMURA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR CIRCUIT, SEMICONDUCTOR DEVICE, METHOD OF DIAGNOSING A...
Publication number
20120098547
Publication date
Apr 26, 2012
LAPIS Semiconductor Co., Ltd.
Kazutoshi INOUE
G01 - MEASURING TESTING
Information
Patent Application
SIGNAL PROCESSOR AND SIGNAL PROCESSING SYSTEM
Publication number
20100169600
Publication date
Jul 1, 2010
Kazutoshi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Process for producing silicon wafer
Publication number
20070059150
Publication date
Mar 15, 2007
SUMCO CORPORATION
Kazutoshi Inoue
C30 - CRYSTAL GROWTH
Information
Patent Application
Semiconductor integrated circuit
Publication number
20060107142
Publication date
May 18, 2006
SONY CORPORATION
Kazutoshi Inoue
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor device
Publication number
20050210186
Publication date
Sep 22, 2005
SONY CORPORATION
Tomofumi Arakawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test circuit and multi-chip package type semiconductor device havin...
Publication number
20040150415
Publication date
Aug 5, 2004
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Application
Test circuit and multi-chip package type semiconductor device havin...
Publication number
20040150414
Publication date
Aug 5, 2004
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Application
Test circuit and multi-chip package type semiconductor device havin...
Publication number
20040150089
Publication date
Aug 5, 2004
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Application
Test circuit and multi-chip package type semiconductor device havin...
Publication number
20040150090
Publication date
Aug 5, 2004
Kazutoshi Inoue
G01 - MEASURING TESTING
Information
Patent Application
Microcontroller
Publication number
20030145245
Publication date
Jul 31, 2003
Kazutoshi Inoue
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test circuit and multi-chip package type semiconductor device havin...
Publication number
20020047192
Publication date
Apr 25, 2002
Kazutoshi Inoue
G01 - MEASURING TESTING