Kazutoshi Kaji

Person

Hitachi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmission scanning microscopy including electron energy loss spe...
- Patent number 10,373,802
- Issue date Aug 6, 2019
- Hitachi High-Technologies Corporation
- Yu Yamazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 8,901,493
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 8,344,320
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 8,134,131
- Issue date Mar 13, 2012
- Hitachi, Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Element mapping unit, scanning transmission electron microscope, an...
- Patent number 7,928,376
- Issue date Apr 19, 2011
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with electron spectrometer
- Patent number 7,888,641
- Issue date Feb 15, 2011
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic microscope apparatus
- Patent number 7,872,232
- Issue date Jan 18, 2011
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for evaluating thin films
- Patent number 7,544,935
- Issue date Jun 9, 2009
- Hitachi, Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 7,476,872
- Issue date Jan 13, 2009
- Hitachi Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for observing inside structures, and specimen...
- Patent number 7,462,830
- Issue date Dec 9, 2008
- Hitachi Ltd.
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,250,601
- Issue date Jul 31, 2007
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Standard sample for transmission electron microscope (TEM) elementa...
- Patent number 7,053,372
- Issue date May 30, 2006
- Samsung Electronics Co., Ltd.
- Gyeong-su Park
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,933,500
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,933,501
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 6,930,306
- Issue date Aug 16, 2005
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for observing element distribution
- Patent number 6,855,927
- Issue date Feb 15, 2005
- Hitachi High-Technologies Corporation
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,794,648
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 6,703,613
- Issue date Mar 9, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRANSMISSION SCANNING MICROSCOPY INCLUDING ELECTRON ENERGY LOSS SPE...
- Publication number 20180308659
- Publication date Oct 25, 2018
- Hitachi High-Technologies Corporation
- Yu YAMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20120241611
- Publication date Sep 27, 2012
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
- Publication number 20110095182
- Publication date Apr 28, 2011
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Observing Inside Structures, and Specimen...
- Publication number 20090302234
- Publication date Dec 10, 2009
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER
- Publication number 20090045340
- Publication date Feb 19, 2009
- Shohei TERADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN...
- Publication number 20070252091
- Publication date Nov 1, 2007
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20060163479
- Publication date Jul 27, 2006
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for evaluating thin films
- Publication number 20060145075
- Publication date Jul 6, 2006
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Element mapping unit, scanning transmission electron microscope, an...
- Publication number 20060011836
- Publication date Jan 19, 2006
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Standard sample for transmission electron microscope (TEM) elementa...
- Publication number 20050184233
- Publication date Aug 25, 2005
- Samsung Electronics Co., Ltd.
- Gyeong-su Park
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20050167589
- Publication date Aug 4, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20050127295
- Publication date Jun 16, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for observing inside structures, and specimen...
- Publication number 20050061971
- Publication date Mar 24, 2005
- Shohei Terada
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20040188613
- Publication date Sep 30, 2004
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20040183011
- Publication date Sep 23, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20040169143
- Publication date Sep 2, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope
- Publication number 20040094712
- Publication date May 20, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for observing element distribution
- Publication number 20040000641
- Publication date Jan 1, 2004
- Yoshifumi Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085356
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085350
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20020096632
- Publication date Jul 25, 2002
- Kazutoshi Kaji
- G01 - MEASURING TESTING

Kazutoshi Kaji

Person

Patents Grantslast 30 patents

Transmission scanning microscopy including electron energy loss spe...

Electron microscope

Electron microscope with electron spectrometer

Method and apparatus for observing inside structures, and specimen...

Element mapping unit, scanning transmission electron microscope, an...

Electron microscope with electron spectrometer

Electronic microscope apparatus

Method and apparatus for evaluating thin films

Method and apparatus for observing inside structures, and specimen...

Method and apparatus for observing inside structures, and specimen...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Standard sample for transmission electron microscope (TEM) elementa...

Electron microscope

Ultimate analyzer, scanning transmission electron microscope and ul...

Electron microscope

Method and apparatus for observing element distribution

Ultimate analyzer, scanning transmission electron microscope and ul...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Patents Applicationslast 30 patents

TRANSMISSION SCANNING MICROSCOPY INCLUDING ELECTRON ENERGY LOSS SPE...

Electron Microscope

ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER

Method and Apparatus for Observing Inside Structures, and Specimen...

ELECTRON MICROSCOPE WITH ELECTRON SPECTROMETER

METHOD AND APPARATUS FOR OBSERVING INSIDE STRUCTURES, AND SPECIMEN...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Method and apparatus for evaluating thin films

Element mapping unit, scanning transmission electron microscope, an...

Standard sample for transmission electron microscope (TEM) elementa...

Electron microscope

Electron microscope

Method and apparatus for observing inside structures, and specimen...

Electron microscope

Energy spectrum measuring apparatus, electron energy loss spectrome...

Ultimate analyzer, scanning transmission electron microscope and ul...

Electron microscope

Method and apparatus for observing element distribution

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Energy spectrum measuring apparatus, electron energy loss spectrome...