Kazutsugu Kikuchi

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Nagano, JP

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Patents Grantslast 30 patents

Information Patent Grant
Tuning fork vibration gyro
- Patent number 6,931,927
- Issue date Aug 23, 2005
- Fujitsu Media Devices Limited
- Kazuhiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Tuning-fork type vibration gyro and electrode trimming method therefor
- Patent number 6,647,786
- Issue date Nov 18, 2003
- Fujitsu Media Devices Limited
- Kazuhiro Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Tuning fork type vibration gyro
- Patent number 6,366,005
- Issue date Apr 2, 2002
- Fujitsu Limited
- Hiroshi Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Tuning fork type vibration gyro
- Patent number 6,327,908
- Issue date Dec 11, 2001
- Fujitsu Limited
- Masanori Yachi
- G01 - MEASURING TESTING
Information Patent Grant
Tuning fork type vibration element and tuning fork type vibration gyro
- Patent number 6,105,426
- Issue date Aug 22, 2000
- Fujitsu Limited
- Masanori Yachi
- G01 - MEASURING TESTING
Information Patent Grant
Tuning fork type vibration gyro
- Patent number 5,996,410
- Issue date Dec 7, 1999
- Fujitsu Limited
- Masanori Yachi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tuning-fork type vibration gyro and electrode trimming method therefor
- Publication number 20050217376
- Publication date Oct 6, 2005
- FUJITSU MEDIA DEVICES LIMITED
- Kazuhiro Ohta
- G01 - MEASURING TESTING
Information Patent Application
Tuning-fork type vibration gyro and electrode trimming method therefor
- Publication number 20040118206
- Publication date Jun 24, 2004
- FUJITSU MEDIA DEVICES LIMITED
- Kazuhiro Ohta
- G01 - MEASURING TESTING
Information Patent Application
Tuning-fork type vibration gyro and electrode trimming method therefor
- Publication number 20020148290
- Publication date Oct 17, 2002
- FUJITSU MEDIA DEVICES LIMITED
- Kazuhiro Ohta
- G01 - MEASURING TESTING
Information Patent Application
Tuning fork type vibration gyro
- Publication number 20010001224
- Publication date May 17, 2001
- FUJITSU LTD.
- Hiroshi Ishikawa
- G01 - MEASURING TESTING