Kazuya Aizawa

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit having a multipurpose resistor for suppression o...
- Patent number 7,675,120
- Issue date Mar 9, 2010
- Sanken Electric Co., Ltd.
- Keiichi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with improved electrostatic tolerance
- Patent number 7,592,683
- Issue date Sep 22, 2009
- Sanken Electric Co., Ltd.
- Akio Iwabuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Voltage measurement device
- Patent number 7,550,945
- Issue date Jun 23, 2009
- Sanken Electric Co., Ltd.
- Akio Iwabuchi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measurement device
- Patent number 7,126,342
- Issue date Oct 24, 2006
- Sanken Electric Co., Ltd.
- Akio Iwabuchi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measuring apparatus
- Patent number 7,023,178
- Issue date Apr 4, 2006
- Sanken Electric Co., Ltd.
- Akio Iwabuchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated Circuit Having a Multipurpose Resistor for Suppression o...
- Publication number 20070108533
- Publication date May 17, 2007
- Sanken Electric Co., Ltd
- Keiichi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device
- Publication number 20060255378
- Publication date Nov 16, 2006
- Sanken Electric Co., Ltd.
- Akio Iwabuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VOLTAGE MEASUREMENT DEVICE
- Publication number 20060186894
- Publication date Aug 24, 2006
- Akio Iwabuchi
- G01 - MEASURING TESTING
Information Patent Application
Voltage measurement device
- Publication number 20060087329
- Publication date Apr 27, 2006
- Sanken Electric Co., Ltd
- Akio Iwabuchi
- G01 - MEASURING TESTING
Information Patent Application
Voltage measuring apparatus
- Publication number 20050218900
- Publication date Oct 6, 2005
- Akio Iwabuchi
- G01 - MEASURING TESTING