Kazuya Iguchi

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 12,174,072
- Issue date Dec 24, 2024
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,892,352
- Issue date Feb 6, 2024
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,852,535
- Issue date Dec 26, 2023
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometric device and spectrometric method
- Patent number 11,828,653
- Issue date Nov 28, 2023
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement device and light measurement method
- Patent number 11,703,389
- Issue date Jul 18, 2023
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement device and light measurement method
- Patent number 11,346,720
- Issue date May 31, 2022
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Sample-container holding member, light measurement device, and samp...
- Patent number 11,150,178
- Issue date Oct 19, 2021
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device comprising light receiving regions of ligh...
- Patent number 10,928,246
- Issue date Feb 23, 2021
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 10,816,402
- Issue date Oct 27, 2020
- Hamamatsu Photonics K.K.
- Kenichiro Ikemura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 10,222,332
- Issue date Mar 5, 2019
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device, spectrum measuring method, and specimen...
- Patent number 10,209,189
- Issue date Feb 19, 2019
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 10,094,779
- Issue date Oct 9, 2018
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 10,036,706
- Issue date Jul 31, 2018
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 9,952,101
- Issue date Apr 24, 2018
- Hamamatsu Photonics K.K.
- Kengo Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Spectrum measuring device and spectrum measuring method
- Patent number 9,423,339
- Issue date Aug 23, 2016
- Hamamatsu Photonics K.K.
- Shigeru Eura
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-yield measurement device
- Patent number 9,024,278
- Issue date May 5, 2015
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-yield measurement device
- Patent number 8,916,836
- Issue date Dec 23, 2014
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 8,643,839
- Issue date Feb 4, 2014
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Quantum-yield measurement device
- Patent number 8,592,780
- Issue date Nov 26, 2013
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer
- Patent number 8,587,779
- Issue date Nov 19, 2013
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, spectrometry, and spectrometry program
- Patent number 8,525,989
- Issue date Sep 3, 2013
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer, spectrometry, and spectrometry program
- Patent number 8,462,337
- Issue date Jun 11, 2013
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector and jig for sample holder
- Patent number 8,324,561
- Issue date Dec 4, 2012
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring fluorescence, apparatus for measuring fluoresc...
- Patent number 6,897,953
- Issue date May 24, 2005
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE
- Publication number 20240192139
- Publication date Jun 13, 2024
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240183795
- Publication date Jun 6, 2024
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE
- Publication number 20240175825
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20240125589
- Publication date Apr 18, 2024
- Hamamatsu Photonics K.K.
- Kenichi OHTSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20240077360
- Publication date Mar 7, 2024
- HAMAMATSU PHOTONICS K. K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20230147189
- Publication date May 11, 2023
- HAMAMATSU PHOTONICS K. K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD
- Publication number 20220082439
- Publication date Mar 17, 2022
- Hamamatsu Photonics K.K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE-CONTAINER HOLDING MEMBER, LIGHT MEASUREMENT DEVICE, AND SAMP...
- Publication number 20210131948
- Publication date May 6, 2021
- Hamamatsu Photonics K.K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
- Publication number 20200348178
- Publication date Nov 5, 2020
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD
- Publication number 20200340862
- Publication date Oct 29, 2020
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE
- Publication number 20200271511
- Publication date Aug 27, 2020
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20200096389
- Publication date Mar 26, 2020
- Hamamatsu Photonics K.K.
- Kenichiro IKEMURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20180292316
- Publication date Oct 11, 2018
- HAMAMATSU PHOTONICS K. K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20170284939
- Publication date Oct 5, 2017
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE AND SPECTROMETRY METHOD
- Publication number 20170261375
- Publication date Sep 14, 2017
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20170212047
- Publication date Jul 27, 2017
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD
- Publication number 20150377770
- Publication date Dec 31, 2015
- Hamamatsu Photonics K.K.
- Shigeru EURA
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...
- Publication number 20150346096
- Publication date Dec 3, 2015
- Hamamatsu Photonics K.K.
- Kengo SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-YIELD MEASUREMENT DEVICE
- Publication number 20140097357
- Publication date Apr 10, 2014
- HAMAMATSU PHOTONICS K. K.
- Kazuya IGUCHI
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-YIELD MEASUREMENT DEVICE
- Publication number 20130248737
- Publication date Sep 26, 2013
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM-YIELD MEASUREMENT DEVICE
- Publication number 20130240754
- Publication date Sep 19, 2013
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM
- Publication number 20110255085
- Publication date Oct 20, 2011
- Hamamatsu Photonics K.K.
- Motoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20110235035
- Publication date Sep 29, 2011
- HAMAMATSU PHOTONICS K. K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER
- Publication number 20110205537
- Publication date Aug 25, 2011
- HAMAMATSU PHOTONICS K. K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM
- Publication number 20110098962
- Publication date Apr 28, 2011
- Hamamatsu Photonics K.K.
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR AND JIG FOR SAMPLE HOLDER
- Publication number 20100108869
- Publication date May 6, 2010
- Kazuya Iguchi
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring flourescence, apparatus for measuring flouresc...
- Publication number 20030151000
- Publication date Aug 14, 2003
- Motoyuki Watanabe
- G01 - MEASURING TESTING

Kazuya Iguchi

Person

Patents Grantslast 30 patents

Spectrometric device and spectrometric method

Spectrometric device and spectrometric method

Spectrometric device and spectrometric method

Spectrometric device and spectrometric method

Light measurement device and light measurement method

Light measurement device and light measurement method

Sample-container holding member, light measurement device, and samp...

Optical measuring device comprising light receiving regions of ligh...

Spectrometry device and spectrometry method

Spectrometry device and spectrometry method

Spectrum measuring device, spectrum measuring method, and specimen...

Optical measurement device and optical measurement method

Spectrometry device and spectrometry method

Spectrometry device and spectrometry method

Spectrum measuring device and spectrum measuring method

Quantum-yield measurement device

Quantum-yield measurement device

Spectrometer

Quantum-yield measurement device

Spectrometer

Spectrometer, spectrometry, and spectrometry program

Spectrometer, spectrometry, and spectrometry program

Photodetector and jig for sample holder

Method for measuring fluorescence, apparatus for measuring fluoresc...

Patents Applicationslast 30 patents

MEASUREMENT DEVICE

MEASURING DEVICE

MEASURING DEVICE

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD

SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD

SPECTROMETRIC DEVICE AND SPECTROMETRIC METHOD

SAMPLE-CONTAINER HOLDING MEMBER, LIGHT MEASUREMENT DEVICE, AND SAMP...

LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD

LIGHT MEASUREMENT DEVICE AND LIGHT MEASUREMENT METHOD

OPTICAL MEASURING DEVICE

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

SPECTROMETRY DEVICE AND SPECTROMETRY METHOD

OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD

SPECTRUM MEASURING DEVICE AND SPECTRUM MEASURING METHOD

SPECTRUM MEASURING DEVICE, SPECTRUM MEASURING METHOD, AND SPECIMEN...

QUANTUM-YIELD MEASUREMENT DEVICE

QUANTUM-YIELD MEASUREMENT DEVICE

QUANTUM-YIELD MEASUREMENT DEVICE

SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM

SPECTROMETER

SPECTROMETER

SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM

PHOTODETECTOR AND JIG FOR SAMPLE HOLDER

Method for measuring flourescence, apparatus for measuring flouresc...