TREA

Kazuya Soma

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  • Kanagawa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Contact probe, probe holder and probe unit
    • Patent number 12,188,977
    • Issue date Jan 7, 2025
    • NHK Spring Co., Ltd.
    • Tsuyoshi Inuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and signal transmission method
    • Patent number 11,940,465
    • Issue date Mar 26, 2024
    • NHK Spring Co., Ltd.
    • Kazuya Soma
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Probe unit
    • Patent number 11,782,074
    • Issue date Oct 10, 2023
    • NHK Spring Co., Ltd.
    • Tsuyoshi Inuma
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe unit
    • Patent number 11,656,246
    • Issue date May 23, 2023
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe unit
    • Patent number 11,422,156
    • Issue date Aug 23, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    CONTACT PROBE AND PROBE UNIT
    • Publication number 20240264200
    • Publication date Aug 8, 2024
    • NHK Spring Co., Ltd.
    • Kazuya Soma
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20240053380
    • Publication date Feb 15, 2024
    • NHK Spring Co., Ltd.
    • Futa Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE HOLDER AND PROBE UNIT
    • Publication number 20240019460
    • Publication date Jan 18, 2024
    • NHK Spring Co., Ltd.
    • Osamu Ito
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE, PROBE HOLDER AND PROBE UNIT
    • Publication number 20230251286
    • Publication date Aug 10, 2023
    • NHK Spring Co., Ltd.
    • Hajime Arai
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20230138105
    • Publication date May 4, 2023
    • NHK Spring Co., Ltd.
    • Tsuyoshi Inuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE CARD
    • Publication number 20230107255
    • Publication date Apr 6, 2023
    • NHK Spring Co., Ltd.
    • Naruhiko Nishiwaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND PROBE UNIT
    • Publication number 20220317155
    • Publication date Oct 6, 2022
    • NHK Spring Co., Ltd.
    • Kohei Hironaka
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND SIGNAL TRANSMISSION METHOD
    • Publication number 20220146552
    • Publication date May 12, 2022
    • NHK Spring Co., Ltd.
    • Kazuya Soma
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE UNIT
    • Publication number 20220011345
    • Publication date Jan 13, 2022
    • NHK Spring Co., Ltd.
    • Tsuyoshi Inuma
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND PROBE UNIT
    • Publication number 20210156887
    • Publication date May 27, 2021
    • Kohei Hironaka
    • G01 - MEASURING TESTING