Kazuya TOMII

Follow

Person

Shirakawa-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for measuring DIC defect shape on silicon wafer and polishin...
- Patent number 12,345,659
- Issue date Jul 1, 2025
- Shin-Etsu Handotai Co., Ltd.
- Kazuya Tomii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining defect region
- Patent number 10,513,798
- Issue date Dec 24, 2019
- Shin-Etsu Handotai Co., Ltd.
- Kazuya Tomii
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING DIC DEFECT SHAPE ON SILICON WAFER AND POLISHIN...
- Publication number 20230125000
- Publication date Apr 20, 2023
- Shin-Etsu Handotai Co., Ltd.
- Kazuya TOMII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING DEFECT REGION
- Publication number 20180312994
- Publication date Nov 1, 2018
- Shin-Etsu Handotai Co., Ltd.
- Kazuya TOMII
- C30 - CRYSTAL GROWTH