Kazuya Yamazaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and adjustment method for charged p...
- Patent number 11,309,161
- Issue date Apr 19, 2022
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and control method of optical system o...
- Patent number 11,222,764
- Issue date Jan 11, 2022
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle system and method for measuring deflection fields...
- Patent number 10,332,720
- Issue date Jun 25, 2019
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam alignment method and electron microscope
- Patent number 10,020,162
- Issue date Jul 10, 2018
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,773,639
- Issue date Sep 26, 2017
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 9,595,416
- Issue date Mar 14, 2017
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of observing TEM images
- Patent number 8,772,714
- Issue date Jul 8, 2014
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evacuating sample holder, pumping system, and electron mi...
- Patent number 8,604,445
- Issue date Dec 10, 2013
- Jeol Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Adjustment Method for Charged P...
- Publication number 20210233739
- Publication date Jul 29, 2021
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Control Method of Optical System o...
- Publication number 20200343072
- Publication date Oct 29, 2020
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam Alignment Method and Electron Microscope
- Publication number 20170301507
- Publication date Oct 19, 2017
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle System and Measuring Method
- Publication number 20170133196
- Publication date May 11, 2017
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope
- Publication number 20170025244
- Publication date Jan 26, 2017
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20150311029
- Publication date Oct 29, 2015
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Method of Observing TEM Images
- Publication number 20130299696
- Publication date Nov 14, 2013
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Evacuating Sample Holder, Pumping System, and Electron Mi...
- Publication number 20130168549
- Publication date Jul 4, 2013
- JEOL Ltd.
- Kazuya Yamazaki
- H01 - BASIC ELECTRIC ELEMENTS

Kazuya Yamazaki

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and adjustment method for charged p...

Charged particle beam device and control method of optical system o...

Charged particle system and method for measuring deflection fields...

Beam alignment method and electron microscope

Electron microscope

Transmission electron microscope

Transmission electron microscope and method of observing TEM images

Method of evacuating sample holder, pumping system, and electron mi...

Patents Applicationslast 30 patents

Charged Particle Beam Apparatus and Adjustment Method for Charged P...

Charged Particle Beam Device and Control Method of Optical System o...

Beam Alignment Method and Electron Microscope

Charged Particle System and Measuring Method

Electron Microscope

Transmission Electron Microscope

Transmission Electron Microscope and Method of Observing TEM Images

Method of Evacuating Sample Holder, Pumping System, and Electron Mi...