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Kazuya Yano

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  • Nirasaki-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBER
    • Publication number 20150226767
    • Publication date Aug 13, 2015
    • TOKYO ELECTRON LIMITED
    • Shuji Akiyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBER AND NEEDLE-TIP POLISHING DEVICE FOR PROBE CARD
    • Publication number 20150204909
    • Publication date Jul 23, 2015
    • TOKYO ELECTRON LIMITED
    • Kazuya Yano
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS AND WAFER MOUNTING TABLE FOR PROBE APPARATUS
    • Publication number 20150145547
    • Publication date May 28, 2015
    • TOKYO ELECTRON LIMITED
    • Kazuya Yano
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20150028907
    • Publication date Jan 29, 2015
    • TOKYO ELECTRON LIMITED
    • Eiichi Shinohara
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS AND SUBSTRATE TRANSFER METHOD
    • Publication number 20110107858
    • Publication date May 12, 2011
    • TOKYO ELECTRON LIMITED
    • Tadashi Obikane
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS, PROBING METHOD AND STORAGE MEDIUM
    • Publication number 20090195263
    • Publication date Aug 6, 2009
    • TOKYO ELECTRON LIMITED
    • Kazuya Yano
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20080290886
    • Publication date Nov 27, 2008
    • TOKYO ELECTRON LIMITED
    • Shuji Akiyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    MOUNTING DEVICE
    • Publication number 20080184916
    • Publication date Aug 7, 2008
    • TOKYO ELECTRON LIMITED
    • Kazuya YANO
    • G12 - INSTRUMENT DETAILS
  • Information Patent Application

    MOUNTING DEVICE
    • Publication number 20080187420
    • Publication date Aug 7, 2008
    • TOKYO ELECTRON LIMITED
    • Hiroshi SHIMOYAMA
    • G01 - MEASURING TESTING