Kazuyasu KAWABE

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wavelength-dispersive X-ray spectrometer
- Patent number 7,864,922
- Issue date Jan 4, 2011
- Jeol Ltd.
- Kazuyasu Kawabe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analysis using X-ray spectra
- Patent number 7,742,565
- Issue date Jun 22, 2010
- Jeol Ltd.
- Kazuyasu Kawabe
- G01 - MEASURING TESTING
Information Patent Grant
Electron probe microanalyzer having wavelength-dispersive x-ray spe...
- Patent number 4,988,872
- Issue date Jan 29, 1991
- Jeol Ltd.
- Yoshitaka Nagatsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wavelength-dispersive X-ray spectrometer
- Publication number 20100284513
- Publication date Nov 11, 2010
- JEOL Ltd.
- Kazuyasu KAWABE
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Analysis Using X-Ray Spectra
- Publication number 20090310748
- Publication date Dec 17, 2009
- JEOL Ltd.
- Kazuyasu KAWABE
- G01 - MEASURING TESTING