Kazuyoshi Nakajima

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing characteristics of thin-film magne...
- Patent number 8,138,754
- Issue date Mar 20, 2012
- TDK Corporation
- Akio Ogawa
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR TESTING CHARACTERISTICS OF THIN-FILM MAGNE...
- Publication number 20090284857
- Publication date Nov 19, 2009
- TDK Corporation
- Akio Ogawa
- G11 - INFORMATION STORAGE